5 results
Looking Inside the Fascinating Nanoworld Controlling Light Emission from InGaN/GaN Quantum Well Devices
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1890-1891
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- July 2010
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Atom-probe Tomography of Surface Oxides in a 20% Cold Worked Stainless Steel Tested Under PWR Primary Water Conditions
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 304-305
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- July 2009
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A UK Facility for Atom Probe Tomography Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 288-289
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- July 2009
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Atom Probe Tomography Studies of GaN-Based Semiconductor Materials
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 280-281
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- July 2009
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Recent Advances in FIB-based Site-specific Atom Probe Specimen Preparation Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1634-1635
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- August 2007
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