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Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S5 / November 2016
- Published online by Cambridge University Press:
- 21 December 2016, pp. 52-53
- Print publication:
- November 2016
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- Article
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