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A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 266-267
- Print publication:
- July 2017
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Scanning Photoemission Spectromicroscopic Study of 4-nm Ultrathin SiO3.4 Protrusions Probe-Induced on the Native SiO2 Layer
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue 6 / December 2011
- Published online by Cambridge University Press:
- 11 October 2011, pp. 944-949
- Print publication:
- December 2011
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How does an Ultrathin Cobalt Film Response to the Presence of a Neighboring Pentacene Layer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1198 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1198-E03-08
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- 2009
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Titania Nano-network Film Templated from Microphase-separated Block Copolymer and its Photocatalysis in Fractured Form
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- Journal:
- Journal of Materials Research / Volume 20 / Issue 6 / June 2005
- Published online by Cambridge University Press:
- 01 June 2005, pp. 1523-1528
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- June 2005
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Effects of N2O Fluence on the PECVD-grown Si-rich SiOx with Buried Si Nanocrystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 862 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, A19.11
- Print publication:
- 2005
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