2 results
Effects of Alloying on Properties of NiSi for CMOS Applications
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 810 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, C4.5
- Print publication:
- 2004
-
- Article
- Export citation
Linewidth Dependence of the Reverse Bias Junction Leakage for Co-Silicided Source/Drain Junctions
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B1.6
- Print publication:
- 2002
-
- Article
- Export citation