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A new beam alignment method in SEM based on parallax principle
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1612-1613
- Print publication:
- August 2021
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New Electrostatic Phase Plate for Phase-Contrast Transmission Electron Microscopy and Its Application for Wave-Function Reconstruction
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue 6 / December 2010
- Published online by Cambridge University Press:
- 15 October 2010, pp. 785-794
- Print publication:
- December 2010
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