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Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate
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- Journal:
- Microscopy and Microanalysis / Volume 5 / Issue 6 / November 1999
- Published online by Cambridge University Press:
- 29 January 2003, pp. 413-419
- Print publication:
- November 1999
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- Article
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