1 results
Calculation of the Surface Excitation Parameter for Si and Ge from Measured Electron Backscattered Spectra by Means of a Monte-Carlo Simulation
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue 4 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 343-348
- Print publication:
- August 2003
-
- Article
- Export citation