5 results
Machine Learning for the Dynamic Scanning Transmission Electron Microscopy Experiment on Solid State Transformations
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1600-1601
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- August 2018
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Leveraging Single Atom Dynamics to Measure the Electron-Beam-Induced Force and Atomic Potentials
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 96-97
- Print publication:
- August 2018
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Atom-by-atom fabrication by electron beam via induced phase transformations
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- Journal:
- MRS Bulletin / Volume 42 / Issue 9 / September 2017
- Published online by Cambridge University Press:
- 08 September 2017, pp. 653-659
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- September 2017
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Atomic Level Structure-Property Relationship in a Spin-Orbit Mott insulator: Scanning Transmission Electron and Scanning Tunneling Microscopy Studies
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 908-909
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- July 2016
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Deep Data Mining in a Real Space: Application to Scanning Probe Microscopy Studies on a “Parent” State of a High Temperature Superconductor
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1418-1419
- Print publication:
- July 2016
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