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Characterization of strain fields in Si1-xGex island structures by means of quantitative high-resolution electron microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 274-275
- Print publication:
- September 2003
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- Article
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