2 results
Structural and Electronic Properties of Oxygen Vacancies in Monoclinic HfO2
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- Journal:
- MRS Online Proceedings Library Archive / Volume 996 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 0996-H01-08
- Print publication:
- 2007
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- Article
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Atomic-scale investigation of the dielectric screening at the interface between silicon and its oxide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E5.1
- Print publication:
- 2003
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- Article
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