5 results
Planarization Materials for Active Matrix Thin Film Transistor Arrays
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1030 / 2007
- Published online by Cambridge University Press:
- 01 February 2011, 1030-G01-07
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- 2007
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Spin-on Gate Dielectric Materials for Next Generation Display Systems
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- Journal:
- MRS Online Proceedings Library Archive / Volume 936 / 2006
- Published online by Cambridge University Press:
- 01 February 2011, 0936-L11-03
- Print publication:
- 2006
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The Effect of Immersion Sn coating on the Electromigration Failure Mechanism and Lifetimes of Cu Dual Damascene Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 863 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, B9.9
- Print publication:
- 2005
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Electromigration of lower and upper Cu lines in dual-damascene Cu interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 766 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E3.13
- Print publication:
- 2003
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Assessment of Reliability of cap layers used in Cu-Black DiamondTM Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 766 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E2.9
- Print publication:
- 2003
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