6 results
Thermal Degradation of Tantalum-Nickel Thin Film Couples
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- Journal:
- MRS Online Proceedings Library Archive / Volume 382 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 389
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- 1995
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Interface Reaction Kinetics for Permalloy-Tantalum Thin Film Couples
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- Journal:
- MRS Online Proceedings Library Archive / Volume 343 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 211
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- 1994
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Non-Destructive Characterization of Porous Silicon Using X-Ray Reflectivity
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 321
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- 1994
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Strain Relaxation and Surface Roughness as a Function of Growth Temperature in Linearly Graded InxAl1-xAs (x=0.05 to 0.25) Buffers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 326 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 395
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- 1993
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