2 results
Influence of Voed Geometry on Electromigration Failure in Via-Line Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 351
- Print publication:
- 1997
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- Article
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A Low Temperature Single-Step RTA Process to form Ultrathin CoSi2 for Mosfet Applications
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- Journal:
- MRS Online Proceedings Library Archive / Volume 402 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 209
- Print publication:
- 1995
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- Article
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