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Wavelet analysis of near-field data and the resolution problem*

Published online by Cambridge University Press:  15 March 1999

D. Barchiesi  and
T. Gharbi
D. Barchiesi
Affiliation:
Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
T. Gharbi*
Affiliation:
CERAH, Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Université de Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
*
dominique.barchiesi@univ-fcomte.fr
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Abstract

In Near-Field Optical microscopy, the resolution is directly related to the experimental conditions of illumination and separation between tip and sample. In general, there is no well-defined linear transfer function of the measurement system. The local resolution can be described by the signal-to-noise ratio, by the separation of individual objects or in terms of data shape sharpness. In this paper we use wavelet analysis to determine local resolution. We deduce the resolution from the characteristics of the wavelet and with the help of the local energy in the decomposition.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 5 , Issue 3 , March 1999 , pp. 297 - 301
Copyright
© EDP Sciences, 1999

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Footnotes

*

This paper was presented at the special CFMCP colloquium held at Strasbourg-Illkirch the July 1st-3rd, 1998.

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