Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-06-21T12:20:08.599Z Has data issue: false hasContentIssue false

Structural, morphology and optical properties of ITO/PEDOT:PSS and ITO/Ag nanoparticles/PEDOT:PSS thin films

Published online by Cambridge University Press:  08 March 2013

Somaiyeh Adibi
Affiliation:
Atomic and Molecular Group, Department of Physics, Tarbiat Modares University, P.O. Box 14115-175, Tehran, Iran Department of Physics, College of Sciences, Shiraz University, Shiraz 71454, Iran
Najmeh Adibi
Affiliation:
Atomic and Molecular Group, Department of Physics, Tarbiat Modares University, P.O. Box 14115-175, Tehran, Iran Department of Physics, College of Sciences, Shiraz University, Shiraz 71454, Iran
Rasoul Malekfar*
Affiliation:
Atomic and Molecular Group, Department of Physics, Tarbiat Modares University, P.O. Box 14115-175, Tehran, Iran
Saeid Davatolhagh
Affiliation:
Department of Physics, College of Sciences, Shiraz University, Shiraz 71454, Iran
Get access

Abstract

In order to investigate the effects and optical properties in the mid-infrared region, thin films of PEDOT:PSS were spin-coated on ITO glasses and ITO/Ag nanoparticles substrates. Scanning Electron Microscopy, SEM, has been applied to investigate the surface morphology and measure the size of nanoparticles. Dielectric and optical coefficients such as refractive index, n, and extinction coefficient, k, were calculated by applying Kramers-Kronig dispersion relations to the experimentally recorded near normal reflection FTIR spectra. Different analyses confirm that Ag nanoparticles are present in the structure of the synthesized thin films. The recorded Raman spectra have shown that the intensity enhancement of Raman peaks of PEDOT:PSS increases due to the plasmon resonance of Ag colloidal silver nanoparticles layer and optical properties investigation has confirmed the electrical conductivity increase in the mid-infrared region.

Type
Research Article
Copyright
© EDP Sciences, 2013

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Wang, X.J., Wong, K.Y., Thin Solid Films 515, 1573 (2006)CrossRef
Semaltianos, N.G., Koidis, C., Pitsalidis, C., Synth. Met. 161, 431 (2011)CrossRef
Skotheim, T.A., Reynolds, J. (eds.), Handbook of Conducting Polymers, 3rd edn. (CRC Press, Boca Raton, Florida, 2007)Google Scholar
Groenendaal, L.B., et al., Adv. Mat. 7, 481 (2000)3.0.CO;2-C>CrossRef
de Kok, M.M., et al., Phys. Stat. Sol. A 201, 1342 (2004)CrossRef
Chou, K.-S., Huang, K.-C., Lee, H.-H., Nanotechnology 16, 779 (2005)CrossRef
Semaltianos, N.G., et al., Chem. Phys. Lett. 484, 283 (2010)CrossRef
Sakmeche, N., et al., Chem. Commun. 24, 2723 (1996)CrossRef
Gauglitz, G., Vo-Dinh, T., Handbook of Spectroscopy (Wiley-VCH, Weinheim, 2003), pp. 7375CrossRefGoogle Scholar
Trager, F., Handbook of Lasers and Optics (Springer, New York, 2007), pp. 253258CrossRefGoogle Scholar
Hapke, B., Theory of Reflectance and Emittance Spectroscopy (Cambridge University Press, Cambridge, UK, 1993), p. 58CrossRefGoogle Scholar
Tompkins, H.G., Irene, E.A., Handbook of Ellipsometry (William Andrew, Inc., Norwich, NY, 2005), pp. 2426CrossRefGoogle Scholar