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Spectroscopic techniques for the assessment of optoelectronic materials: application to laser diodes

Published online by Cambridge University Press:  15 July 2004

J. Jiménez ,
E. Cánovas  and
M. Avella
J. Jiménez*
Affiliation:
Física de la Materia Condensada ETS Ingenieros Industriales 47011 Valladolid, Spain
E. Cánovas
Affiliation:
Física de la Materia Condensada ETS Ingenieros Industriales 47011 Valladolid, Spain
M. Avella
Affiliation:
Física de la Materia Condensada ETS Ingenieros Industriales 47011 Valladolid, Spain
*
jimenez@fmc.uva.es
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Abstract

Spectroscopic techniques are necessary for the characterization of optoelectronic materials. Among the experimental means used for such characterization, luminescence techniques play a relevant role because they supply information about the mechanisms generating light and are sensitive to structural aspects. Raman spectroscopy provides useful information about alloy instabilities and is sensitive to stress and temperature. Results concerning optoelectronic materials are presented with special emphasis on the application of these techniques to the degradation of laser diodes.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 27 , Issue 1-3: Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X) , July 2004 , pp. 67 - 73
Copyright
© EDP Sciences, 2004

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