Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-06-19T06:23:57.492Z Has data issue: false hasContentIssue false
  • English
  • Français

Near-field imaging of the photocurrent on a patternedAu/GaAs interface with various wavelengths and bias*

Published online by Cambridge University Press:  15 March 1999

S. Davy ,
M. Spajer ,
J. Almeida ,
R. Generosi ,
A. Cricenti ,
G. Faini  and
C. Coluzza
S. Davy
Affiliation:
Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Institut des Microtechniques (FR W0067 CNRS), UFR Sciences, 25030 Besançon Cedex, France
M. Spajer
Affiliation:
Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Institut des Microtechniques (FR W0067 CNRS), UFR Sciences, 25030 Besançon Cedex, France
J. Almeida
Affiliation:
École Polytechnique Fédérale PH–Ecublens, 1015 Lausanne, Switzerland
R. Generosi
Affiliation:
CNR-ISM, via E. Fermi 38, 00044 Frascati Roma, Italy
A. Cricenti
Affiliation:
CNR-ISM, via E. Fermi 38, 00044 Frascati Roma, Italy
G. Faini
Affiliation:
L2M-CNRS, 196 avenue Henri Ravera, B.P. 107, 92225 Bagneux Cedex, France
C. Coluzza
Affiliation:
INFN, Dipartimento di Fisica, Università di Roma "La Sapienza" P. le A. Moro, 00185 Roma, Italy
Get access

Abstract

This contribution presents an application of scanning near-field optical microscopy to the characterization of semi-conductors. It is based on the photocurrent mapping of a patterned Au/GaAs structure (Schottky barrier) under local illumination by the nanosource. The results obtained with different wavelengths, metallized or dielectric probes and different bias voltages exhibit photocurrent variations independent of the topography and induced by interface defects. Finally, from this study of a patterned planar structure, we propose a method to determine the mean free path of the charge carriers in the volume.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 5 , Issue 3 , March 1999 , pp. 283 - 288
Copyright
© EDP Sciences, 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

A. Richter, M. Sueptitz, C. Lienau, T. Elsaesser, R. Nötzel, M. Ramsteiner, K. Ploog, Quantum wire, in 4th International Conference on Near-Field Optics, Jerusalem, 1997, p. 17.
Cella, R., Mersali, B., Bruno, A., Davy, S., Brückner, H.J., Licoppe, C., J. Appl. Phys. 78, 4339 (1995). CrossRef
N.V. Hulst, M. Moers, E. Borgonjen, Application of near-field optical microscopy: fluorescence in situ hybridisation, Langmuir-Blodgett films and integrated optical waveguides, in Photons and Local Probes , edited by O. Marti, R. Möller (Kluwer Academic Publishers, 1995), pp. 165-180.
Hörsch, I., Kushe, R., Marti, O., Weigl, B., Ebeling, K.J., J. Appl. Phys. 79, 3831 (1996). CrossRef
T. Wilson, C. Sheppard, Theory and practice of scanning optical microscopy (Academic Press, London, 1984).
Karrai, K., Kolb, G., Abstreiter, G., Schmeller, A., Ultramicroscopy 61, 299 (1995). CrossRef
Buratto, S.K., Hsu, J.W.P., Betzig, E., Trautman, J.K., Bylsma, R.B., Bahr, C.C., Cardillo, M.J., Appl. Phys. Lett. 65, 2654 (1994). CrossRef
Ünlü, M.S., Goldberg, B.B., Herzog, W.D., Appl. Phys. Lett. 67, 1862 (1995). CrossRef
Goldberg, B.B., Ünlü, M.S., Herzog, W.D., Ghaemi, H.F., Towe, E., IEEE J. Quant. Electr. 1, 1073 (1995). CrossRef
Almeida, J., T. dell'Orto, C. Coluzza, G. Margaritondo, O. Bergossi, M. Spajer, D. Courjon, Appl. Phys. Lett. 69, 2361 (1996). CrossRef
Hsu, J.W.P., Fitzgerald, E.A., Xie, Y.H., Silverman, P.J., Appl. Phys. Lett. 65, 344 (1994). CrossRef
Hsu, J.W.P., Fitzgerald, E.A., Xie, Y.H., Silverman, P.J., J. Appl. Phys. 79, 7743 (1996). CrossRef
E.H. Rhoderick, R.H. Williams, Metal-semiconductor contacts (Clarendon, Oxford, 1988).
Courjon, D., Vigoureux, J.M., Spajer, M., Sarayeddine, K., Leblanc, S., Appl. Opt. 29, 3734 (1990). CrossRef
E.D. Palik, Handbook of optical constants of solids (Academis Press, 1985).
Davy, S., Spajer, M., Appl. Phys. Lett. 69, 3306 (1996). CrossRef
Stähelin, M., Bopp, M.A., Tarrach, G., Meixner, A.J., Zschokkle-Gränacher, I., Appl. Phys. Lett. 68, 2603 (1996). CrossRef
Yakobson, B.I., LaRosa, A., Hallen, H.D., Paesler, M.A., Ultramicroscopy 61, 179 (1995). CrossRef