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Microstructure, dielectric and ferroelectric characterization of Ba doped PLZT ceramics

Published online by Cambridge University Press:  23 June 2006

K. Ramam  and
V. Miguel
K. Ramam*
Affiliation:
Departmento de Ingeneria de Materials, (DIMAT), Facultad de Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C, Concepcion, Chile
V. Miguel
Affiliation:
Departmento de Ingeneria de Materials, (DIMAT), Facultad de Ingenieria, Universidad de Concepcion, Edmundo Larenas 270, Casilla 160 C, Concepcion, Chile
*
ramamk@udec.cl
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Abstract

Ba doped PLZT ceramic compositions with formula Pb0.982−zLa0.012Δ0.006Baz(Zr0.55Ti0.45)O3 for z = 0 to 6 mole% are synthesized by mixed-oxide method. Powder XRD studies indicate the coexistence of rhombohedral and tetragonal phase in 5 mole% Ba doped PLZT composition. SEM pictures show grain size control as Ba concentration increases in PLZT system. $\varepsilon_{rt}$ and tan δ are increased up to 4 mole% and 5 mole% Ba doped PLZT composition respectively. Dielectric maximum ($\varepsilon_{T_C}$) is decreased to 4 mole% Ba doped PLZT and Curie temperature (TC) is decreased with increase of Ba concentration in PLZT system. Coercive field (Ec) has shown gradual enhancement over series. Remanent (Pr) and spontaneous (Ps) polarizations are decreased to 5 mole% Ba doped PLZT composition.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 35 , Issue 1 , July 2006 , pp. 43 - 47
Copyright
© EDP Sciences, 2006

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