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Measurement and prediction of contact angles of Pb-free Sn-Ag solder alloys on Cu substrate

Published online by Cambridge University Press:  13 April 2011

A. M. Erer
Affiliation:
Department of Physics, Karabuk University, 78200 Karabuk, Turkey
E. Candan*
Affiliation:
Department of Mechanical and Manufacturing Engineering, Bilecik University, Gulumbe Kampusu, 11210 Bilecik, Turkey
M. H. Güven
Affiliation:
Department of Physics, Zonguldak Karaelmas University, 67100 Zonguldak, Turkey
Y. Turen
Affiliation:
Department of Metals, Karabuk University, 78200 Karabuk, Turkey
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Abstract

The contact angle (Θ) of molten Sn and Sn-Ag alloys (0.5, 1.5, 3.5, 6 wt.% Ag) on Cu substrates have been studied by using sessile drop method at various temperatures (230, 250, 275 and 300 °C). Experimental results showed that additions of Ag to Sn resulted in a continuous decrease in the Θ up to 3.5 wt.% above which the Θ value was increased. Increasing alloy temperature also decreased the Θ proportionally. Experimental results revealed that a correlation between the Θ, alloy composition and the alloy temperature exists which yielded an empirical model to predict the Θ at a given Ag content and temperature for a given Sn-Ag alloy. The empirical model predicts the Θ reasonably well with the present work and the other published works.

Type
Research Article
Copyright
© EDP Sciences, 2011

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References

Kamal, M., Gouda, E.S., Eur. Phys. J. Appl. Phys. 40, 203 (2007) CrossRef
Yoon, S.W., Choi, W.K., Lee, H.M., Scr. Mater. 40, 297 (1998) CrossRef
Bonn, D., Eggers, J., Indekeu, J., Meunier, J., Rolley, E., Rev. Mod. Phys. 81, 739 (2009) CrossRef
Kumar, G., Prabhu, K.N., Adv. Colloid Interface Sci. 133, 61 (2007) CrossRef
Kamal, M., Gouda, E.S., J. Mater. Sci. Mater. Electron. 19, 81 (2008) CrossRef
Zang, L., Yuan, Z., Zhao, H., Zhang, X., Mater. Lett. 63, 2067 (2009) CrossRef
Arenas, M.F., Acoff, V.L., J. Electron. Mater. 33, 12 (2004) CrossRef
Yu, C., Lu, H., Li, S., J. Alloys Compd. 460, 594 (2008) CrossRef
Moser, Z., Gasior, W., Pstrus, J., Debski, A., Int. J. Thermophys. 29, 1974 (2008) CrossRef
Lu, H.Y., Balkan, H., Ng, K.Y.S., JOM 57, 30 (2005) CrossRef
Vianco, P.T., Frear, D.R., JOM 45, 14 (1993) CrossRef
Long, J., Hyder, M.N., Huang, R.Y.M., Chen, P., Adv. Colloid Interface Sci. 118, 173 (2005) CrossRef
Arenas, M.F., Acoff, V.L., J. Electron. Mater. 33, 12 (2004) CrossRef
Kamusewitz, H., Possart, W., Paul, D., Colloids Surf. A 156, 271 (1999) CrossRef
Candan, E., Atkinson, H.V., Turen, Y., Salaoru, I., Candan, S., J. Am. Ceram. Soc. 94, 867 (2011) CrossRef
Li, J., Yuan, Z., Qiao, Z., Fan, J., Xu, Y., Ke, J., J. Colloid Interface Sci. 297, 261 (2006) CrossRef
Yuan, Z., Mukai, K., Takagi, K., Ohtaka, M., Huang, W.L., Liu, Q.S., J. Colloid Interface Sci. 254, 338 (2002) CrossRef
Amore, S., Ricci, E., Lanata, T., Novakovic, R., J. Alloys Compd. 452, 161 (2008) CrossRef
S.C. Kang, C. Kim, J. Muncy, M. Schmidt, D. Baldwin, in Proc. of 29th IEEE/CPMT/SEMI Int. Electronics Manufacturing Technology Symp., San Jose, CA, 2004
Zhang, X., Yuan, Z., Zhao, H., Zang, L., Li, J., Chinese Sci. Bull. 55, 797 (2010) CrossRef
Bernardin, J.D., Mudawar, I., Walsh, C.B., Franses, I., Int. J. Heat Mass Transfer 40, 1017 (1997) CrossRef
K. Bukat, J. Sitek, L. Hozu, R. Bulwith, Global SMT Packaging J., 1 (2002)
Takao, H., Tsukada, T., Yamada, K., Yamashita, M., Hasegawa, H., R&D Review of Toyota CRDL 39, 41 (2004)