Hostname: page-component-7479d7b7d-pfhbr Total loading time: 0 Render date: 2024-07-11T22:23:44.407Z Has data issue: false hasContentIssue false

Improvement of near-field fluorescence imaging of bulk materials by metalcoating*

Published online by Cambridge University Press:  15 May 1999

D. Pastré
Affiliation:
Université de Reims, Unité de Thermique et Analyse Physique, EA 2061, 21 rue Clément Ader, 51685 Reims Cedex 2, France
M. Troyon*
Affiliation:
Université de Reims, Unité de Thermique et Analyse Physique, EA 2061, 21 rue Clément Ader, 51685 Reims Cedex 2, France
Get access

Abstract

By using a simple model based on a linear susceptibility approach and taking into account the dynamic nature of the molecule's electronic structure, the electric field diffracted by the near-field probe is evaluated in the presence or absence of a thin silver layer deposited on the surface of a bulk fluorescent material. This modeling points out that the far-field signal emitted by the molecules situated far from the tip is important in the absence of metal coating and can reduce the near-field detection sensitivity. It shows that surface metal coating enhances the near-field contribution and decreases the far-field one. Cathodoluminescence images obtained on a fluorite (CaF2:Eu) sample confirm the results predicted by modeling.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

This paper was presented at the special Colloquium CFMCP held at Strasbourg-Illkirch the July 1st-3rd, 1998.

References

Phol, D.W., Denk, W., Lanz, M., Appl. Phys. Lett. 44, 651 (1984).
Betzig, E., Chichester, R.J., Science 262, 1422 (1993). CrossRef
Xie, X.S., Dunn, R.C., Science 265, 361 (1994). CrossRef
Harris, T.D., Gershoni, D., Pfeiffer, L., Nirmal, M., Trautman, J.K., Mackin, J.J., Semicond. Sci. Technol. 11, 1569 (1996). CrossRef
Duncan, W.M., Mat. Res. Soc. Symp. 406, 183 (1996). CrossRef
Rahamani, A., de Fornel, F., Opt. Commun. 131, 253 (1996). CrossRef
Troyon, M., Pastré, D., Jouart, J.P., Beaudoin, J.L., Ultramicroscopy 75, 15 (1998). CrossRef
Xiao, M., Opt. Commun. 132, 403 (1996). CrossRef
Carminati, R., Greffet, J.-J., Ultramicroscopy 61, 11 (1995). CrossRef
Hecht, B., Bielefeldt, H., Inouye, Y., Pohl, D.W., Novotny, L., J. Appl. Phys. 81, 2492 (1997). CrossRef
Pastré, D., Grossel, Ph., Troyon, M., J. Phys. D 31, 2718 (1998). CrossRef
Kerker, M., Wang, D.S., Chew, H., Appl. Opt. 19, 4159 (1980). CrossRef
Aravind, P.K., Metiu, H., Chem. Phys. Lett. 74, 301 (1980). CrossRef
C. Cohen-Tannoudji, J. Dupont-Roc, G. Gryndberg, Processus d'interaction entre photons et atomes (EDP Sciences/CNRS Éditions, 1988).
Klick, C.C., Schulman, J.H., Solid. Stat. Phys. 5, 97 (1957). CrossRef
Agarwal, G.S., Phys. Rev. A 11, 230 (1975)APS Link not valid for this citation Phys. Rev. A 11, 243 (1975)APS Link not valid for this citation Phys. Rev. A 11, 253 (1975). APS Link not valid for this citation CrossRef
Wylie, J.M., Sipe, J.E., Phys. Rev. A 30, 1185 (1984) ; Phys. Rev. A 32, 2030 (1985). CrossRef
Girard, C., Bouju, X., J. Chem. Phys. 95, 2056 (1991). CrossRef
Chance, R.R., Prock, A., Silbey, R., Adv. Chem. Phys. 37, 1 (1978).
Ford, G.W., Weber, W.H., Surf. Sci. 109, 451 (1981). CrossRef
Zeisel, D., Dutoit, B., Deckert, V., Roth, T., Zenobi, R., Anal. Chem. 69, 749 (1997). CrossRef
Troyon, M., Lei, H.N., Wang, Z., Shang, G., Microsc. Microanal. Microsctruct. 8, 393 (1997). CrossRef
B.G. Yacobi, D.B. Holt, Cathodoluminescence microscopy of inorganic solids (Plenum press, New York, 1990), p. 74.