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High frequency characterization of the thin film ferrites BaM and YIG

Published online by Cambridge University Press:  28 June 2007

Z. Zerrougui ,
A. Merzouki  and
D. Vincent
Z. Zerrougui*
Affiliation:
Département d'électronique, Faculté des sciences de l'ingénieur, Université Ferhat Abbes, Setif, Algeria
A. Merzouki
Affiliation:
Département d'électronique, Faculté des sciences de l'ingénieur, Université Ferhat Abbes, Setif, Algeria
D. Vincent
Affiliation:
Laboratoire DIOM, ISTASE, Saint-Étienne, France
*
zerrougui2000@yahoo.fr
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Abstract

New microwave electronic technology challenges require the integration of many passive components onto chips. Among them, isolators and circulators are non-reciprocal passive devices that contain magnetic materials. It is therefore important to know the magnetic properties of suitable materials. The permeability tensor is the most important parameter to define, because it governs the interaction between the electromagnetic wave and the material, and is thus the origin of all magnetic phenomenons. Our work consists of performing the characterization of thin films of BaM and YIG over a frequency range of 0.4 GHz to 65 GHz. The work shows the presence of a gyroresonance phenomenon and locates the resonance frequencies. The technique is based on S parameter measurements on the magnetic materials performed with a network analyser and a probe tester. Polder's model is used to calculate the different elements of the permeability tensor, which consider the ferrite in its saturated state.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 39 , Issue 1 , July 2007 , pp. 45 - 50
Copyright
© EDP Sciences, 2007

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References

B. Lax, K.J. Button, Microwave Ferrites and Ferrimagnetics (Mc Graw-Hill, Book Company)
P. Brissonneau, Magnétisme et matériaux magnétique pour l'électronique (Hermes, Paris, 1997)
B. Bayard, B. Sauviac, D. Vincent, The Wiley Encyclopedia of RF and Microwave Engineering, Ferrite Isolators, January 29, 2004.
Bayard, B., Vincent, D., Simovski, R., Noyel, G., IEEE Trans. Microw. Theory Tech. 51, 7 (2003) CrossRef
Quéfélec, P., Mallégol, S., Le Floc'h, M., IEEE Trans. Microw. Theory Tech. 50, 9 (2002) CrossRef
Polder, D., Philos. Mag. 40, 99 (1949) CrossRef
J. Jerome, Green, S. Frank, IEEE Trans. Microw. Theory Tech. MTT-22, 6 (1974)
Gelin, P., Pichavant, K., IEEE Trans. Microw. Theory Tech. 45, 8 (1997) CrossRef
Th. Rouiller, B. Bayard, B. Sauviac, G. Noyel, Reproductibilité des mesures avec testeur sous pointes (de 40 MHz à 65 GHz), 17 e Colloque International, Optique Hertzienne et Diélectrique, OHD (2003), p. 39
Boudiar, T., Th, C. Nader. Rouiller, J. Phys. IV France 124, 159 (2005) CrossRef
Capraro, M. Le Berre, J.P. Chatelon, H. joisten, E. Mery, B. Bayard, J.J. Rousseau, D. Barbier, Sensors and Actuators A 113, 382 (2004) CrossRef
Vincent, D., Rouiller, Th., Simovsky, C., Bayard, B., Noyel, G., IEEE Trans. Microw. Theory Tech. 53, 4 (2005) CrossRef
P. Cheng, Wen, IEEE Trans. Microw. Theory Tech. MTT-17, 12 (1969)
Quéfélec, P., Le Floc'h, M., Gelin, P., IEEE Trans. Instrum. Meas. 47, 4 (1998) CrossRef