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Heat-treatment effect on the structural and optical properties of flash evaporated Sb2Te3 thin films

Published online by Cambridge University Press:  06 August 2008

H. S. Soliman*
Affiliation:
Physics Department, Girl's College, King Abdul Aziz University, Jeddah, Saudi Arabia
S. Yaghmour
Affiliation:
Physics Department Faculty of Science, King Abdul Aziz University, Jeddah, Saudi Arabia
H. G. Al-Solami
Affiliation:
Physics Department, Girl's College, King Abdul Aziz University, Jeddah, Saudi Arabia
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Abstract

The effect of thickness and heat treatment on the structural and optical properties of Sb2Te3 thin films fabricated by using flash evaporation technique were investigated. The as-deposited films were found to be stoichiometric. For the as-deposited and annealed samples of thickness in the range of 20.7–120.5 nm, large variations in transmittance and reflectance were observed for wavelength below 2000 nm due to strong absorption, while slight variations were observed above 2000 nm. The optical constants, n and k, measured in the range of 500–4000 nm, increased slightly by annealing the samples at 573 K for 2 h in air and a red shift was observed. Allowed indirect transitions were observed for the as-deposited and the annealed samples. The results showed two energy gaps for these transitions varied from 0.28 to 0.31 eV for the as-deposited samples and from 0.56 to 0.54 eV for the annealed films. The spectral distribution of the real part of the dielectric constant ε′ showed a maximum at 0.73 eV for the as-deposited films decreased to 0.65 eV by annealing.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2008

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References

Zakery, A., Elliott, S.R., J. Non-Cryst. Sol. 330, 1 (2003) CrossRef
Bureau, B., Zhang, X.H., Smektala, F., Adam, J., Troles, J., Hong-Li Ma, C. Boussarad-Pledel, J. Lucas, P. Lucas, D. Le Coq, M.R. Riley, J.H. Simmons, J. Non-Cryst. Sol. 345-346, 276 (2004) CrossRef
Popescu, M., J. Non-Cryst. Sol. 352, 887 (2006) CrossRef
Frumar, M., Frumarova, B., Nemec, P., Wagner, T., Jedelsky, J., Hrdlicka, M., J. Non-Cryst. Sol. 352, 544 (2006) CrossRef
Kokenyesi, S., Iván, I., Takáts, V., Pálinkás, J., Biri, S., Szabo, I.A., J. Non-Cryst. Sol. 353, 1470 (2007) CrossRef
Zimmer, A., Stein, N., Terryn, H., Boulanger, C., J. Phys. Chem. Solids 68, 1902 (2007) CrossRef
Ohta, T., Nishiuchi, K., Narumi, K., Jpn J. Appl. Phys. 39, 770 (2000) CrossRef
Maeda, T., Terao, M., Shimano, T., Jpn J. Appl. Phys. 42, 1044 (2003) CrossRef
Wang, W.H., Chung, L.C., Kuo, C.T., Surf. Coat. Technol. 177, 795 (2004) CrossRef
Yu, J., Liu, B., Zhang, T., Song, Z., Feng, S., Chen, B., Appl. Surf. Sci. 253, 6125 (2007) CrossRef
van Pieterson, L., Lankhorst, M.H.R., van Schijndel, M., Kuiper, A.E.T., Roosen, J.H.J., J. Appl. Phys. 97, 083520 (2005) CrossRef
H. Scherrer, S. Scherrer, in CRC Handbook of Thermoelectrics, Chemical Rubber, edited by D.M. Rowe (Boca Raton, FL, 1995), p. 211
Chien, Y.-J., Zhou, Z., Uher, C., J. Cryst. Growth 283, 309 (2005) CrossRef
Fujimori, S., Yagi, S., Yamazaki, H., Funakoshi, N., J. Appl. Phys. 64, 1000 (1988) CrossRef
C.W. Sun, J.Y. Lee, M.S. Youm, Y. T. Kim, Jpn J. Appl. Phys. 45, 9157 ( 2006)
Arun, P., Pankaj Tyagi, A.G. Vedeshwar, V.K. Paliwal, Physica B 307, 105 (2001) CrossRef
Rajasekar, K., Subbarayan, A., Sathyamoorthy, R., Dheepa, J., Ionics 10, 291 (2004) CrossRef
Prokhorov, E., González-Hernández, J., Hernández-Landaverde, M.A., Chao, B., Morales-Sánchez, E., J. Phys. Chem. Sol. 68, 883 (2007) CrossRef
Her, Y.-C., Chen, H., Hsu, Y.-S., J. Appl. Phys. 93, 10097 (2003) CrossRef
Giani, A. , Boulouz, A., Pascal-Delannoy, F., Foucaran, A., Charles, E., Boyer, A., Mat. Sci. Eng. B 64, 19 (1999) CrossRef
Kim, Y., DiVenere, A., Wong, G.K.L., Ketterson, J.B., Cho, S., Meyer, J.R., J. Appl. Phys. 91, 715 (2002) CrossRef
Ahmed, E., Hill, A.E., Pilkington, R.D., Tomlinson, R.D., Levoska, J., Kusmartseva, O., Leppävuori, J., Adv. Mater. Opt. Electron. 4, 423 (2004) CrossRef
S. Tolansky, Multiple-Beam Interferometry of Surface and Films (Oxford University, London, 1978)
El-Nahass, M.M., J. Mat. Sci. 27, 6597 (1992) CrossRef
Murmann, H., Z. Phys. 101, 643 (1936) CrossRef
Cisneros, J.I., Appl. Opt. 37, 5262 (1998) CrossRef
J. Tauc, Amorphous and Liquid Semiconductors (Plenum, New York, 1974), Chap. 4
Rogers, L.M., J. Phys. D 1, 854 (1968)
Losurdo, M., Giangregorio, M.M., Luchena, M., Capezzuto, P., Bruno, G., Toro, R.G., Malandrino, G., Fragala, I.L., Nigro, R. Lo, Appl. Surf. Sci. 253, 322 (2006) CrossRef
Ashtoni, A.M., Green, G.W., J. Phys. F: Metal Phys. 3, 179 (1973) CrossRef
P.O. Edward, Hand Book of Optical Constants of Solids (Academic Press, New York, 1985), p. 265
Bell, R.J., Ordal, M.A., Alexander Jr, R.W.., Appl. Opt. 24, 3680 (1985) CrossRef