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Focusing effect in X-ray diffraction imaging of LiNbO3crystals under static electric field

Published online by Cambridge University Press:  15 December 1999

P. Pernot-Rejmánková ,
W. Laprus  and
J. Baruchel
P. Pernot-Rejmánková*
Affiliation:
European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France
W. Laprus
Affiliation:
Polish Academy of Sciences, Swietokrzyska 21, 00049 Warszawa, Poland
J. Baruchel
Affiliation:
European Synchrotron Radiation Facility, B.P. 220, 38043 Grenoble, France
*
rejma@esrf.fr
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Abstract

The X-ray diffracted intensity changes considerably when a static electric field is applied perpendicularly to a X- or Y-cut LiNbO3 platelet-shaped crystal. Section diffraction images (topographs) recorded using synchrotron radiation in transmission mode reveal the curvature of the lattice planes under such a field. A theoretical analysis based on the equations of electro-mechanical field in a piezoelectric medium together with chemical etching experiments allows us to explain this effect. Tiny inverted ferroelectric doMayns produced by the applied field exert a strain on the non-inverted bulk leading to the observed curvature of the lattice planes. This approach seems to be valid for other piezoelectric crystals of various symmetry classes.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 8 , Issue 3 , December 1999 , pp. 225 - 232
Copyright
© EDP Sciences, 1999

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