Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-07-04T11:53:20.029Z Has data issue: false hasContentIssue false

The effect of small variations in the magnetization curves of shielding material upon shielded fields

Published online by Cambridge University Press:  13 June 2007

A. Kost*
Affiliation:
Lehrstuhl Allgemeine Elektrotechnik und Numerische Feldberechnung, Brandenburgische Technische Universität Cottbus, Postfach 101344, 03013 Cottbus, Germany
R. T. Jacobs
Affiliation:
Lehrstuhl Allgemeine Elektrotechnik und Numerische Feldberechnung, Brandenburgische Technische Universität Cottbus, Postfach 101344, 03013 Cottbus, Germany
A. Hahn
Affiliation:
Lehrstuhl Allgemeine Elektrotechnik und Numerische Feldberechnung, Brandenburgische Technische Universität Cottbus, Postfach 101344, 03013 Cottbus, Germany
Get access

Abstract

The shielding of strong electromagnetic fields at power frequency, performed by ferromagnetic plates, is often successfully modelled by the effective reluctivity. This method delivers good results for the RMS value of the shielded field. The following paper shows that a small variation of the magnetization curve (e.g. by taking another material charge) can strongly influence the shielded field. The field calculation is performed by the Finite Element Method (FEM), where for the interior plate region a) finite elements and b) non-linear Impedance Boundary Conditions (IBC) are used which circumvents the need to discretize the shielding plate.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Lederer, D., Kost, A., IEEE Trans. Magn. 34, 3060 (1998) CrossRef
Lederer, D., Igarashi, H., Kost, A., Honma, T., COMPEL 18, 410 (1999) CrossRef
Lavers, J.D., IEEE Trans. Magn. 19, 2201 (1983) CrossRef
Kost, A., Bastos, J.P.A., Miethner, K., Jänicke, L., IEEE Trans. Magn. 38, 573 (2002) CrossRef