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Computational study of sheath structure in chemically active plasmas

Published online by Cambridge University Press:  28 October 2011

P. Cerny
Affiliation:
J.E. Purkinje University, Faculty of Science, Department of Physics, Ceske mladeze 8, 40096 Usti nad Labem, Czech Republic
S. Novak*
Affiliation:
J.E. Purkinje University, Faculty of Science, Department of Physics, Ceske mladeze 8, 40096 Usti nad Labem, Czech Republic
R. Hrach
Affiliation:
J.E. Purkinje University, Faculty of Science, Department of Physics, Ceske mladeze 8, 40096 Usti nad Labem, Czech Republic Charles University, Faculty of Mathematics and Physics, Department of Surface and Plasma Science, V Holesovickach 2, 18000 Prague 8, Czech Republic
V. Hrachova
Affiliation:
Charles University, Faculty of Mathematics and Physics, Department of Surface and Plasma Science, V Holesovickach 2, 18000 Prague 8, Czech Republic
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Abstract

Results of computer simulations describing an interaction between a low-temperature multicomponent plasma and an immersed metal substrate are presented. For this purpose, computer model of volume processes in a DC glow discharge in Ar-O2 mixture and a particle model of plasma-solid interaction were created. The interaction is studied not only in case when a constant value of voltage bias on the immersed substrate is kept, but also when sinusoidal voltage bias is applied. A pressure dependence of the sheath region in electronegative plasma is shown, too.

Type
Research Article
Copyright
© EDP Sciences, 2011

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References

Ostrikov, K., Tsakadze, Z., Rutkevych, P.P., Long, J.D., Xu, S., Denysenko, I., Contrib. Plasma Phys. 45, 514 (2005)CrossRef
Birdsall, C.K., Langdon, A.B., Plasma Physics via Computer Simulation (IoP Publishing, Bristol, Philadelphia, 1991)CrossRefGoogle Scholar
Wendt, J.F. (ed.), Computational Fluid Dynamics – An Introduction (Springer, New York, 1992), pp. 3149CrossRefGoogle Scholar
Hrachova, V., Kanka, A., in Proc. of XIIIth ISPC, Beijing, China, 1997, vol. II, p. 517
Hrach, R., Hrachova, V., Vicher, M., Simek, J., in Proc. of 16th ISPC, Taormina, Italy, 2003, p. 145
Franklin, R.N., J. Phys. D: Appl. Phys. 36, 2655 (2003)CrossRef
Lieberman, M.A., Lichtenberg, A.J., Principles of Plasma Discharges and Materials Processing (Wiley, New York, 1994)Google Scholar
Eliasson, B., Kogelschatz, U., Basic Data for Modelling of Electrical Discharges in Gases: Oxygen (Brown Boveri Konzernforschung, Baden, 1986)Google Scholar
Ionin, A.A., Kochetov, I.V., Napartovich, A.P., Yuryshev, N.N., J. Phys. D: Appl. Phys. 40, R25 (2007)CrossRef
Hsu, C.-C., Nierode, M.A., Coburn, J.W., Graves, D.B., J. Phys. D: Appl. Phys. 39, 3272 (2006)CrossRef
Jacobs, H., Miethke, F., Rutscher, A., Wagner, H.E., Contrib. Plasma Phys. 36, 471 (1996)CrossRef
Lee, C., Lieberman, M.A., J. Vac. Sci. Technol. A 13, 368 (1995)CrossRef
Baguer, N., Bogaerts, A., Donko, Z., Gijbels, R., Sadeghi, N., J. Appl. Phys. 97, 123305 (2005)CrossRef
Palop, J.I.F., Ballesteros, J., Hernandez, M.A., Morales Crespo, R., Borrego del Pino, S., J. Appl. Phys. 95, 4585 (2004)CrossRef
Bronold, F.X., Matyash, K., Tskhakaya, D., Schneider, R., Fehske, H., J. Phys. D: Appl. Phys. 40, 6583 (2007)CrossRef
Hockney, R.W., Eastwood, J.W., Computer Simulation Using Particles (Taylor and Francis, Bristol, 1988)CrossRefGoogle Scholar
Shewchuk, J.R., An Introduction to the Conjugate Gradient Method Without the Agonizing Pain, Technical Report: CS-94-125, Carnegie Mellon University, Pittsburgh, 1994Google Scholar
Snir, M., Otto, S., Huss-Lederman, S., Walker, D., Dongarra, J., MPI: The Complete Reference (MIT, Massachusetts, 1996)Google Scholar
Kanka, A., Ph.D. thesis, Charles University, Prague, 1996
Kutasi, K., Guerra, V., Sa, P., J. Phys. D: Appl. Phys. 43, 175201 (2010)CrossRef