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Sub-wavelength surface IR imaging of soft-condensed matter

Published online by Cambridge University Press:  07 July 2010

J. H. Rice
Affiliation:
School of Chemical Science and Pharmacy, University of East Anglia, Norwich, NR4 7TJ, UK
G. A. Hill
Affiliation:
School of Chemical Science and Pharmacy, University of East Anglia, Norwich, NR4 7TJ, UK
S. R. Meech
Affiliation:
School of Chemical Science and Pharmacy, University of East Anglia, Norwich, NR4 7TJ, UK
P. Kuo
Affiliation:
Ginzton Laboratory, Stanford University, Stanford, 94305-4088CA, USA
K. Vodopyanov
Affiliation:
Ginzton Laboratory, Stanford University, Stanford, 94305-4088CA, USA
M. Reading
Affiliation:
School of Chemical Science and Pharmacy, University of East Anglia, Norwich, NR4 7TJ, UK
Corresponding
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Abstract

Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.

Type
Research Article
Copyright
© EDP Sciences, 2010

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References

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