No CrossRef data available.
Article contents
Study of the structure of PZT films: influence of the thermal treatments. Advanced ferroelectric characterisation
Published online by Cambridge University Press: 19 January 2004
Abstract
Thin films of PbZr$_{(1-x)}$TixO3 have been elaborated using the
sol-gel process. We have characterised the thermal behaviour of the sol and
of the film of PZT. The different orientations were observed according to
the temperature of pyrolysis: [111] at 500 °C, [100] at 450 °C.
Finally, an advanced method of electrical characterisation of ferroelectrics
is used by separating the reversible and irreversible contributions of
polarisation. An experimental Preisach density is then measured and modeled
and allows to extract ferroelectric properties. These parameters are
independent from electric field strength applied through the sample, leading
to a powerful tool to characterise the electrical behaviour.
- Type
- Research Article
- Information
- The European Physical Journal - Applied Physics , Volume 25 , Issue 2 , February 2004 , pp. 97 - 106
- Copyright
- © EDP Sciences, 2004