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Structural and optical characteristics of CdS thin films deposited by infrared pulsed-laser technique

Published online by Cambridge University Press:  13 June 2007

A. F. El Deeb
A. F. El Deeb*
Affiliation:
Physics Department, Faculty of Education, Ain Shams University, Heliopolis 11757, Cairo, Egypt
*
Dr.A.Eldeeb@gmail.com
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Abstract

The influence of preparation conditions on the structure and optical properties of cadmium sulphide (CdS) thin films deposited on quartz substrates by means of the pulsed laser technique have been investigated. Oriented growth of hexagonal CdS nanoparticulate film with the C-axis perpendicular to the plane of the surface has been achieved up to a film thickness of 220 nm. The results indicate that the heat treatment played an important role on both crystal structure and optical properties. The grain size and the crystallinity of the films were increased, as well as the optical energy gap $E_{\it g}^{\it opt} $ (allowed direct transitions) was increased from 2.45 to 2.50 eV upon annealing. The dispersion of the refractive index of virgin and annealed films were estimated and explained using the Wemple-Didomenico (WD) single-oscillator model. The dispersion parameters and the free charge carrier concentrations were also estimated.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 38 , Issue 3 , June 2007 , pp. 247 - 252
Copyright
© EDP Sciences, 2007

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References

Chuu, D.S., Dai, C.M., Hsieh, W.F., Tsai, C.T., J. Appl. Phys. 69, 8402 (1991) CrossRef
Nair, M.T.S., Nair, P.K., Zingaro, R.A., Meyers, E.A., J. Appl. Phys. 75, 1557 (1994) CrossRef
Tsai, C.T., Chuu, D.S., Chen, G.L., Yang, S.L., J. Appl. Phys. 79, 9105 (1996) CrossRef
Lee, J., Tsakalakos, T., Nanostruct. Mater. 8, 381 (1997) CrossRef
Roy, U.N., Kukreja, L.M., J. Cryst. Growth 250, 405 (2003) CrossRef
Alex Chediak, J., Luo, Z., Seo, J., Cheung, N., Lee, L.P., Sands, T.D., Sens. Actuators A 111, 1 (2004) CrossRef
Ullrich, B., Sakai, H., Segawa, Y., Thin Solid Films 385, 220 (2001) CrossRef
Subba Ramaiah, K., Pilkington, R.D., Hill, A.E., Tomlinson, R.D., Bhatnagar, A.K., Mat. Chem. Phys. 68, 22 (2001) CrossRef
Yano, S., Ullrich, B., Thin Solid Films 444, 295 (2003) CrossRef
Ashour, A., Turk. J. Phys. 27, 551 (2003)
Raji, P., Sanjeeviraja, C., Ramachandran, K., Bull. Mater. Sci. 28, 233 (2005) CrossRef
Tong, X.L., Jiang, D.S., Luo, M.Z., Liu, L., Xiong, L.C., Mater. Sci. Eng. B 136, 62 (2007) CrossRef
Feldman, B.J., Duisman, J.A., Appl. Phys. Lett. 37, 1092 (1981) CrossRef
El-Shazly, A.A., El-Nahass, M.M., J. Optics 10, 37 (1981)
Gracia-Jiménez, M., Martinez, G., Martinez, J.L., Gómez, E., Zeha, A., J. Electrochem. Soc. 131, 2974 (1984) CrossRef
Ichimura, M., Goto, F., Arai, E., J. Appl. Phys. 85, 7411 (1999) CrossRef
Ullrich, B., Schroeder, R., IEEE J. Quantum Electron 37, 1363 (2001) CrossRef
Khanlary, M., Townsend, P., Ullrich, B., Hole, D.E., J. Appl. Phys. 97, 23512 (2005) CrossRef
Perna, G., Capozzi, V., Pagliara, S., Ambrico, M., Lojacono, D., Thin Solid Films 387, 208 (2001) CrossRef
Erlacher, A., Miller, H., Ullrich, B., J. Appl. Phys. 95, 2927 (2004) CrossRef
Womack, M., Venden, M., Molian, P., Appl. Surf. Sci. 221, 99 (2004) CrossRef
Perriére, J., Millon, E., Seiler, W., Boulmer-Leborgane, C., Craciun, V., Albert, O., Loulergue, J.C., Etchepare, J., J. Appl. Phys. 91, 690 (2002) CrossRef
S. Tolansky, Multiple-Beam Interferometry of Surfaces and Films (Oxford University, London, 1978)
Uplane, M.D., Pawar, S.H., Solid State Commun. 46, 847 (1983) CrossRef
Perna, G., Capozzi, V., Pagliara, S., Ambrico, M., Lojacono, D., Thin Solid Films 387, 208 (2001) CrossRef
Soliman, H.S., Kadry, N. EL, Gamjoum, O., EL-Nahass, M.M., Darwish, H.B., Indian J. Opt. 17, 64 (1988)
Murmann, O., Z. Phys. 101, 643 (1936) CrossRef
Nìmec, P., Frumar, M., Jedelsky, J., Jelinek, M., Lanèok, J., Gregora, I., J. Non-Cryst. Solid 1013, 299 (2002)
De Sario, M., Leggieri, G., Luches, A., Martino, M., Prudenzano, F., Rizzo, A., Appl. Surf. Sci. 216, 186 (2002)
Nìmec, P., Frumar, M., J. Opto. Adv. Mater. 5, 1047 (2003)
Kumar, G.A., Thomas, J., George, N., Kumar, B.A., Radhakrishnan, P., Nampoori, V.P.N., Vallabhan, C.P.G., J. Phys. Chem. Glasses 41, 89 (2000)
Cardona, M., Harbeke, G., Phys. Rev. A 137, 1437 (1965) CrossRef
Roy, U.N., Mallik, K., Kukreja, L.M., Appl. Phys. A 67, 259 (1998) CrossRef
K. Seeger, Semiconductor Physics (Springer, Berlin, 1999)
pal, U., Gonzalez, R.S., Montes, G.M., Jimenez, M.G., Vidal, M.A., Torres, Sh., Thin Solid Films 305, 345 (1997) CrossRef
Su, B., Choy, K.L., Thin Solid Films 359, 160 (2000) CrossRef
A.H. Clark Polycrystalline and Amorphous Thin Films and Devices, edited by L.L. Kazmerski (Academic Press, New York, 1980)
Baban, C., Rusu, G.I., Appl. Surf. Sci. 211, 6 (2003) CrossRef
Wemple, S. H., DiDomenico, M., J. Phys. Rev. B 3, 1338 (1971) CrossRef
P.D. Edward, Hand book of Optical constants of Solids (Academic Press, New York, 1985), p. 265