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Microwave and optical properties of monoclinic Bi2Zn2/3Nb4/3O7 thin films

Published online by Cambridge University Press:  23 April 2012

K. Sudheendran ,
M.K. Singh ,
M.G. Krishna  and
J.K.C. Raju
K. Sudheendran*
Affiliation:
Department of Ceramics and Glass Engineering, CICECO, University of Aveiro, Aveiro 3810-195, Portugal
M.K. Singh
Affiliation:
Center of Material Science, University of Allahabad, Allahabad 221 006, India
M.G. Krishna
Affiliation:
School of Physics, University of Hyderabad, Hyderabad 500 046, India
J.K.C. Raju
Affiliation:
School of Physics, University of Hyderabad, Hyderabad 500 046, India
*
asudhi_skp@yahoo.co.in
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Abstract

Bismuth zinc niobate (Bi2Zn2/3Nb4/3O7) thin films were deposited by PLD on fused silica substrates at different oxygen pressures. The structural, microwave dielectric, optical and Raman characteristics of these thin films were systematically studied for both the as-deposited films and films annealed at 600 °C. The microwave dielectric constant at a frequency of 10 GHz of the annealed m-BZN films varied from 56 to 71, whereas the dielectric loss tangent varied from 1.8 × 10−4 to 3.5 × 10−4 as a function of deposition pressure. The as-deposited films exhibit refractive index in the range of 2.06–2.15 with an optical absorption edge value between 3.59 and 3.67 eV. The observed Raman scattering in m-BZN thin films was slightly shifted toward the higher frequency which reveals that the local lattice disorder changes whereas the structure remains the same monoclinic in thin film as well as in bulk.

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 58 , Issue 1 , April 2012 , 10303
Copyright
© EDP Sciences, 2012

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References

Cava, R.J., J. Mater. Chem. 11, 54 (2001)CrossRef
Negas, T., Ling, H. (eds.), Materials and Processes for Wireless Communications, Ceramic Transaction, vol. 53 (American Ceramic Society, Westerville, OH, 1995), pp. 137–151Google Scholar
Akbas, M.A., Davies, P.K., J. Am. Ceram. Soc. 81, 678 (1998)
Wang, X., Wang, H., Yao, X., J. Am. Ceram. Soc. 80, 2745 (1997)CrossRef
Nino, J.C., Lanagan, M.T., Randall, C.A., J. Appl. Phys. 89, 4512 (2001)CrossRef
Ren, W., Trolier-Mckinstry, S., Randall, C.A., Shrout, T.R., J. Appl. Phys. 89, 767 (2001)CrossRef
Lu, J.W., Stemmer, S., Appl. Phys. Lett. 83, 2411 (2003)CrossRef
Tagantsev, A.K., Lu, J., Stemmer, S., Appl. Phys. Lett. 86, 032901 (2005)CrossRef
Swartz, S.L., Shrout, T.R., U.S. Patent No. 5449652, 1995
Yan, M.F., Ling, H.C., Mater. Chem. Phys. 44, 37 (1996)CrossRef
Cheng, H.F., Chen, Y.C., Lin, I.N., J. Appl. Phys. 87, 479 (2000)CrossRef
Sudheendran, K., James Raju, K.C., Integr. Ferroelectr. 119, 89 (2010)CrossRef
Ghanashyam Krishna, M., Pillier, J.S., Bhattacharya, A.K., Thin Solid Films 357, 218 (1999)CrossRef
Hartridge, A., Ghanashyam Krishna, M., Bhattacharya, A.K., J. Phys. Chem. Solids 59, 845 (1998)CrossRef
Krupka, J., Clarke, R.N., Rochard, O.C., Gregory, A.P., in XIII Int. Conf. MIKON’2000, Wroclaw, Poland (2000), pp. 305–308
Miller, C.F., Simmons, G.W., Wei, R.P., Scr. Mater. 42, 227 (2000)CrossRef
Fan, H.T., Pan, S.S., Teng, X.M., Ye, C., Li, G.H., Zhang, L.D., Thin Solid Films 513, 142 (2006)CrossRef
Nino, J.C., Reaney, I.M., Lanagan, M.T., Randall, C.A., Mater. Lett. 57, 414 (2002)CrossRef
Krupka, J., Gregory, A.P., Rochard, O.C., Clarke, R.N., Riddle, B., Baker-Jarvis, J., J. Eur. Ceram. Soc. 10, 2673 (2001)CrossRef
Krupka, J., Geyer, R.G., Baker-Jarvis, J., Ceremuga, J., in 7th Int. Conf. on Dielectric Materials, Measurements and Applications, Bath, UK, 1996, pp. 21–24
Wang, H., Kamba, S., Zhang, M., Yao, X., Denisov, S., Kadlec, F., Petzelt, J., J. Appl. Phys. 100, 034109 (2006)CrossRef
Sudheendran, K., James Raju, K.C., Sing, M.K., Katiyar, R.S., J. Appl. Phys. 104, 104104 (2008)CrossRef
Zanetti, S.M., Silva, S.A.D., Mater. Res. 10, 261 (2007)CrossRef
Chen, M., Tanner, D.B., Nino, J.C., Phys. Rev B 72, 054303 (2005)CrossRef
Cheng, H.F., Chen, Y.C., Lin, I.N., J. Appl. Phys. 81, 479 (2000)CrossRef
Tauc, J.C., Optical Properties of Solids (North-Holland, Amsterdam, 1972)Google Scholar
Davis, E.A., Mott, N.F., J. Phil. Mag. 22, 903 (1970)CrossRef
Xiaohong, W., Wei, Q., Weidong, H., J. Mol. Catal. A: Chemistry 261, 167 (2006)CrossRef