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Degradation kinetics of the spectral emission in polyfluorene light-emitting electro-chemical cells and diodes

Published online by Cambridge University Press:  16 September 2003

T. Ouisse ,
O. Stéphan  and
M. Armand
T. Ouisse*
Affiliation:
Laboratoire de Spectrométrie Physique, Université Joseph Fourier, Grenoble 1 and CNRS UMR C5588, 140 rue de la physique, BP 87, 38042, Saint-Martin d'Hères Cedex, France
O. Stéphan
Affiliation:
Laboratoire de Spectrométrie Physique, Université Joseph Fourier, Grenoble 1 and CNRS UMR C5588, 140 rue de la physique, BP 87, 38042, Saint-Martin d'Hères Cedex, France
M. Armand
Affiliation:
Laboratoire International sur les Matériaux Électroactifs, CNRS, UMR 2289, Université de Montréal, CP 6128, Montréal QC H3C 3J7, Canada
*
ouisse@spectro.ujf-grenoble.fr
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Abstract

We have studied the well known spectral shift of polyfluorene blue light emitters, using either electrochemical cells or conventional organic light emitting diodes. From the recording of the electroluminescence spectra as a function of “stress” time, we conclude that the degradation mainly depends on the number of electrons which have passed through the conducting polymer, rather than on the hole current magnitude or the dissipated power.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 24 , Issue 3 , December 2003 , pp. 195 - 200
Copyright
© EDP Sciences, 2003

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References

Scherf, U., List, E.J.W., Adv. Mater. 14, 477 (2002) 3.0.CO;2-9>CrossRef
Weinfurtner, K.H., Fujikawa, H., Tokito, S., Taga, Y., Appl. Phys. Lett. 76, 2502 (2000) CrossRef
Grice, A.W., Bradley, D.D.C., Bernius, M.T., Inbasekaran, M., Wu, W.W., Woo, E.P., Appl. Phys. Lett. 73, 629 (1998) CrossRef
Stéphan, O., Collomb, V., Vial, J.C., Armand, M., Synth. Met. 113, 257 (2000) CrossRef
Ouisse, T., Stéphan, O., Armand, M., Leprêtre, J.C., J. Appl. Phys. 92, 2795 (2002) CrossRef
Ouisse, T., Armand, M., Kervella, Y., Stéphan, O., Appl. Phys. Lett. 81, 3131 (2002) CrossRef
List, E.J.W., Guentner, R., Scianducci de, P. Freitas, U. Scherf, Adv. Mater. 14, 374 (2002) 3.0.CO;2-U>CrossRef
Zojer, E., Pogantsch, A., Hennebicq, E., Beljonne, D., Brédas, J.L., Scianducci de, P. Freitas, U. Scherf, E.J.W. List, J. Chem. Phys. 117, 6794 (2002) CrossRef
Panozzo, S., Vial, J.C., Kervella, Y., Stéphan, O., J. Appl. Phys. 92, 3495 (2002) CrossRef
O. Stéphan et al. (unpublished)
Neher, D., Grüner, J., Cimrova, V., Schmidt, W., Rulkens, R., Lauter, U., Polym. Adv. Technol. 9, 461 (1998) 3.0.CO;2-R>CrossRef
Gao, J., Yu, G., Heeger, A.J., Appl. Phys. Lett. 71, 1293 (1997) CrossRef
De Mello, J.C., Tessler, N., Graham, S.C., Friend, R.H., Phys. Rev. B 57, 12951 (1998) CrossRef
Royet, A.S., Ouisse, T., Cabon, B., Noblanc, O., Arnodo, C., Brylinski, C., IEEE Trans. Electron Devices 47, 2221 (2000) CrossRef
Kervella, Y., Armand, M., Stéphan, O., J. Electrochem. Soc. 148, H155 (2001) CrossRef