Editor's Note: As part of our plan to reprint previously published papers of great historical interest, the editorial board is pleased to reproduce the following paper by Hanawalt, Frevel and Rinn. This paper was originally published in Volume 10 (1938) of the Analytical Ediction of “Industrial and Engineering Chemistry” and is considered by most diffractionists to be the classic work in qualitative identification of multiphase polycrystalline material. The original publication carried a foreword written by the editor of Industrial and Engineering Chemistry. This foreword ended with this prophetic statement:

“There is reason to believe that this publication, which is made possible in this form by the generous financial assistance of the Dow Chemical Company, will serve to bring this method of analysis into general use in industrial and consulting analytical laboratories.”

Although there is mounting interest in the measurement of stresses in composite materials after fabrication and/or use, few measurements to date have not taken into account the three dimensional nature of the stress system in such materials. Most data give only the net stress, that is, the difference between principal stresses. A procedure for a more complete measurement (in a reasonable time) is developed here, including the separation of macrostresses and microstresses. If time does not permit a full investigation, measurements of the lattice parameters of the component phases provide a simple way to sample the hydrostatic component due to differential thermal contraction. The Barrett-Predecki method of adding filler is particularly promising for stress measurements in those composites whose component phases do not give appropriate diffraction peaks. This procedure could also be used for monitoring stresses during the useful life of such materials.

Internal elastic strain (i.e., residual stress) and the diffracted X-ray intensity variation over several orientations of crystallites with respect to the specimen surface were investigated as a means of differentiating two qualities of polycrystalline nickel plating. A unique instrument based upon a position-sensitive scintillation X-ray detector was used to apply all of the techniques commonly applied to X-ray stress analysis in this investigation. It was concluded that residual stress measurements did not provide a clear distinction between the two specimens, but comparison of the relative intensities diffracted from crystallographic planes at certain orientations with the surface did provide a distinction.

A method is presented for correction of integrated X-ray intensities for preferred orientation of crystallites in a spinning specimen. It is based upon direct integration of the data obtainable from pole distribution of a single crystallographic plane. This pole distribution can be determined from measurements on a texture goniometer or, in special cases, from an ω-scan or from intensities of all reflections measured on a powder diffractometer only. The method was tested on four samples of magnesium and magnesium cadmium alloys and applied to hexagonal BN and α-Ti(N) surface layers. The method was developed with regard to application in phase analysis and thin film studies.

The indexed X-ray diffraction powder data of trans-bis(dimethylphenylphosphine)bis(pyrazole)platinum, {Pt(C3H4N2)2[P(CH3)2(C6H5)]2, PTPP} and trans-(tricyclohexylphosphino) (triethylphosphino) platinum(II) chloride, (PtCl2P2C24H48, PTHE) are reported. PTPP crystallizes in the monoclinic space group C2/c and PTHE crystallizes in the orthorhombic space group Pcab. The refined cell parameters were determined by employing a Siemens Debye-Scherrer camera (Fe radiation, λmean = 1.93736 Å). The cell constants are a = 21.516(5), b = 6.287(1), c = 17.929(4)Å, β = 102.51(1)°, V = 2367.7Å3 Dx=1.70Mg m−3, Dm = 1.70Mg m−3 for PTPP and a = 12.271(1), b = 19.375(1), c = 23.864(3)Å, V = 5673.4Å3, Dx = 1.553Mg m−3 for PTHE. The quantitative figures of merit (FN) are F23 = 47(0.010,51) [F20 = 60(0.009,35)] for PTPP and F30 = 12(0.008,324) [F20 = 27(0.017,105)] for PTHE. The JCPD S Diffraction File No. for PTPP is 37-1999 and for PTHE is 37-2000.

Introduction: Phase transition has been recently observed in Cs2CdI4 (Touchard, Louër, Auffrédic & Louër, 1986). Thermal analysis has shown that the transformation occurs at 122°C. By quenching, the high temperature phase (β) can be stabilized at room temperature. In the present work we report the X-ray diffraction powder data, at room temperature, for the two phases α- and β-Cs2CdI4. Both phases have been indexed automatically by using powder indexing methods.

The variables of reflection overlap, crystallinity and crystallite size, primary extinction, microabsorption, chemical substitutions, preferred orientation, and analytical procedures affect quantitative analysis by powder X-ray diffraction. The intensity of the strongest reflection (I) of 39 minerals from a typical sedimentary environment divided by the intensity of the strongest reflection (Ic) of corundum, I/Ic, may be used to determine mineral percentages. Because of the numerous variables mentioned above, the I/Ic ratios used should be taken from multi-mineral specimens that occur either in the same geological formation for quantitative analysis (±7%) or in a similar geological formation for quantitative analysis (±30%).

A quantitative X-ray diffraction method for the phase analysis of fertilizers of the NPK 12-19-19 type has been worked out together with a complex system of computer software. A bank of synthetic standards was employed in the solution of the problem. To reflect the real structure of the phases determined in fertilizers as against the structure of synthetic standards, intensity coefficients based on chemical analyses were assigned to individual phases in the bank of standards.

Ternary systems CuO-M2O3-TO2 with T = Si, Ge and M3+ = Al, Ga, Fe, Cr, Bi and Y were investigated at 1000°C. Ternary compounds were found only for M3+ = Y. CuY2Ge2O8 is monoclinic with a = 9.477 Å, b = 15.005 Å, c = 8.030 Å and β = 147.50°; CuY2 Si4 O12 is monoclinic with a = 7.052 Å, b = 14.283 Å, c = 4.738 Å and β = 103.32°; CuY2Ge4O12 is triclinic with a = 7.185 Å, b = 7.949 Å, c = 4.910 Å, α = 86.83°, β = 102.70° and γ = 113.84°. The last two structures are closely related. The binary double oxide series Cu2Ln2O5 was reinvestigated.

The aim of any diffraction experiment is to obtain reproducible data of high accuracy and precision so that the data can be correctly interpreted and analyzed. Various methods of sample preparation have been devised so that reproducibility, precision and accuracy can be obtained. The success of a diffraction experiment will often depend on the correct choice of preparation method for the sample being analyzed and for the instrument being used in the analysis.

A diffraction pattern contains three types of useful information: the positions of the diffraction maxima, the peak intensities, and the intensity distribution as a function of diffraction angle. This information can be used to identify and quantify the contents of the sample, as well as to calculate the material's crystallite size and distribution, crystallinity, and stress and strain. The ideal preparation for a given experiment depends largely on information desired.

The following new or updated patterns are submitted by the JCPDS Research Associateship at the National Bureau of Standards. The patterns are a continuation of the series of standard X-ray diffraction powder patterns published previously in the NBS Circular 539, the NBS Monograph 25, and in this journal. The methods of producing these reference patterns are described in this journal, Vol. 1, No. 1, p. 40 (1986).

The data for each phase apply to the specific sample described. A sample was mixed with 1 or 2 internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2-theta values for these standards are specified in the methods described (ibid.). Data from which the reported 2-theta values were determined, were measured with a computer controlled diffractometer. Computer programs were used to locate peak positions and calibrate the patterns as well as to perform variable indexing and least squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer program.