Powder Diffraction: Volume 25 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 25 - Issue 2 - June 2010

Contents

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Denver X-Ray Conference

D-62 Clever Diffractometers with the Incoatec Microfocus Source
T. Samtleben, C. Michaelsen, B. Hasse, J. Graf, J. Wiesmann
Published online by Cambridge University Press:

20 May 2016, p. 210
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D-66 High Brilliance Microfocus Sources with Scatterless Collimation for Improved SAXS
S. Rodrigues, P. Panine, V. Roger, P. Høghøj
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20 May 2016, p. 210
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D-86 Empyrean—The World of X-ray Diffraction Is No Longer Flat
M. Fransen
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20 May 2016, p. 210
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F-9 Combined X-ray Imaging and Spectroscopy—A Low Cost Solution
D. Lane, J. Lyons
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20 May 2016, p. 210
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F-10 High Speed 2D and 3D MXRF—Imaging with Bench Top Technology
U. Waldschlaeger, M. Haschke
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20 May 2016, p. 210
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F-16 Readout ASICs for Silicon Drift Detectors
L. Bombelli, C. Fiorini, A. Celani, A. Longoni, R. Alberti, T. Frizzi, R. Nava
Published online by Cambridge University Press:

20 May 2016, p. 211
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F-51 Bruker EDXRF New Product Releases and News 2010
A. Seyfarth, A. Gross, J. Patterson, B. Kaiser
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20 May 2016, p. 211
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F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation
A. Niculae, A. Liebel, A. Simsek, O. Jaritschin, H. Soltau, A. Liebel, R. Eckhardt, G. Lutz, S. Jeschke, P. Lechner, L. Strüder, F. Schopper, G. Schaller, C. Fiorini
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20 May 2016, p. 211
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F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF
M. Kraemer, T. Holz, R. Dietsch, D. Weissbach, G. Falkenberg, R. Simon, U. Fittschen, T. Krugmann, B. Beckhoff
Published online by Cambridge University Press:

20 May 2016, p. 211
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F-73 High-Definition XRF — Multiple Monochromatic Beams EDXRF — For Consumer Product Analysis
Z. W. Chen, S. Nayar
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20 May 2016, p. 211
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D-94 Invited—In-Situ and Time Resolved Small-Angle X-ray Scattering
B. G. Landes, B. J. Kern, T. J. Hermel-Davidock, M. Demirors, J. D. Weinhold, G. R. Marchand, K. Nanjundiah, R. E. Drumright, S. J. Weigand
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20 May 2016, p. 211
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D-84 Invited—The Structure and Hydrogen Bonding of a Highly Disordered Fiber
J. D. Londono, A. D. English, P. Langan, Y. Nishiyama, T. Forsyth
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20 May 2016, p. 211
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D-29 Investigation of Microstructural Changes in Impacted Polyurea Coatings Using Small-Angle X-ray Scattering (SAXS)
E. Balizer, J. Fedderly, G. Lee, S. Bartyczak, W. Mock
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20 May 2016, p. 211
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D-53 Invited—Analysis of the Equatorial Streak in Small-Angle X-ray Scattering Patterns: Investigation of Deformation in Carbon Nanotube-Reinforced Polyacrylonitrille Fibers
N. S. Murthy, W. Wang
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20 May 2016, p. 211
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D-68 Invited—Transient Microstructure of Thermoplastic Polyurethane Nanocomposites Under Uniaxial Deformation
H. Koerner, R. Vaia
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20 May 2016, p. 212
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D-83 Element-Specific Structure of Nanosized Materials by High-Energy Resonant X-ray Diffraction and Differential Atomic Pair Distribution Functions
V. Petkov, S. Shastri
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20 May 2016, p. 212
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D-98 Progress with the GSAS-II Software Package for Crystallography
B. H. Toby, R. B. Von Dreele
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20 May 2016, p. 212
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D-75 Preferred Orientation in Polymer Fibers
C. Burger, B. S. Hsiao, B. Chu
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20 May 2016, p. 212
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D-11 Polymer-Oriented Tools in the Irena Package for Small-Angle Scattering Data Analysis
J. Ilavsky
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20 May 2016, p. 212
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D-99 Relaxation Behaviors of Nanoparticles In Polymer Composites: Influence of Local Frictions by Polymer Chains
B. Lee, P. Thiyagarajan, S. Narayanan, A. Sandy, C. -T. Lo, V. Pol, D. Bohnsack
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20 May 2016, p. 212
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Page 3 of 8

First
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1
2
3
4
5
6
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Last

Powder Diffraction

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Volume 25 - Issue 2 - June 2010

Denver X-Ray Conference

D-62 Clever Diffractometers with the Incoatec Microfocus Source

D-66 High Brilliance Microfocus Sources with Scatterless Collimation for Improved SAXS

D-86 Empyrean—The World of X-ray Diffraction Is No Longer Flat

F-9 Combined X-ray Imaging and Spectroscopy—A Low Cost Solution

F-10 High Speed 2D and 3D MXRF—Imaging with Bench Top Technology

F-16 Readout ASICs for Silicon Drift Detectors

F-51 Bruker EDXRF New Product Releases and News 2010

F-57 Excellent Performance with 100 mm2 Silicon Drift Detectors for X-rays and Gamma Radiation

F-70 Ultrathin Multi-Element Layer Stacks — A New Type of Reference Samples for μ-XRF and TXRF

F-73 High-Definition XRF — Multiple Monochromatic Beams EDXRF — For Consumer Product Analysis

D-94 Invited—In-Situ and Time Resolved Small-Angle X-ray Scattering

D-84 Invited—The Structure and Hydrogen Bonding of a Highly Disordered Fiber

D-29 Investigation of Microstructural Changes in Impacted Polyurea Coatings Using Small-Angle X-ray Scattering (SAXS)

D-53 Invited—Analysis of the Equatorial Streak in Small-Angle X-ray Scattering Patterns: Investigation of Deformation in Carbon Nanotube-Reinforced Polyacrylonitrille Fibers

D-68 Invited—Transient Microstructure of Thermoplastic Polyurethane Nanocomposites Under Uniaxial Deformation

D-83 Element-Specific Structure of Nanosized Materials by High-Energy Resonant X-ray Diffraction and Differential Atomic Pair Distribution Functions

D-98 Progress with the GSAS-II Software Package for Crystallography

D-75 Preferred Orientation in Polymer Fibers

D-11 Polymer-Oriented Tools in the Irena Package for Small-Angle Scattering Data Analysis

D-99 Relaxation Behaviors of Nanoparticles In Polymer Composites: Influence of Local Frictions by Polymer Chains

Powder Diffraction

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Volume 25 - Issue 2 - June 2010

Denver X-Ray Conference