Technical Articles
Human exposure to lead and new evidence of adverse health effects: Implications for analytical measurements
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- 29 February 2012, pp. 175-181
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Combined multiple-excitation FP method for micro-XRF analysis of difficult samples
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- 29 February 2012, pp. 182-186
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Certification of NIST Standard Reference Material 640d
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- 29 February 2012, pp. 187-190
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International Reports
2010 ICDD Annual Spring Meetings
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- 29 February 2012, pp. 191-199
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Book Review
Two-Dimensional X-Ray Diffraction Author: Bob B. He, John Wiley and Sons, New York, 2009: ISBN 9780470227220, 426 pages + prefix. Joseph H. Reibenspies and Nattamai Bhuvanesh
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- 29 February 2012, p. 200
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International Reports
Calendar of Forthcoming Meetings
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- 29 February 2012, p. 201
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Short Courses & Workshops
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- 29 February 2012, p. 202
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Denver X-Ray Conference
Denver X-ray Conference
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- 20 May 2016, pp. 203-208
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D-52 Investigations of the Defect Structure of Transparent Conductors Using X-ray and Neutron Scattering Techniques
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- 20 May 2016, p. 209
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D-76 Insights into Thermoelectric Materials: New Structures and Properties
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- 20 May 2016, p. 209
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D-35 In-Situ Diffraction: An Important Tool for the Development of Renewable Energy Technologies
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- 20 May 2016, p. 209
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D-91 Unraveling the Inner Workings of Energy-Related Materials Using In-Situ X-ray Absorption Techniques
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- 20 May 2016, p. 209
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F-36 FP-Based EDXRF Characterization of Thin Film Solar Cells
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- 20 May 2016, p. 209
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C-2 The Latest Development of Microfocusing Source Based Beam Modules and Their Applications
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- 20 May 2016, p. 210
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D-5 A New Geometry for 21st Century Diffraction
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- 20 May 2016, p. 210
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D-15 A New Approach to High Throughput Diffraction Analysis
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- 20 May 2016, p. 210
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D-24 Design and Development of Compound X-ray Optical Systems
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- 20 May 2016, p. 210
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D-44 X-ray Source, Optic and Detector for Two-Dimensional XRD
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- 20 May 2016, p. 210
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D-45 Development of In Situ X-ray Diffraction System for Hydrothermal Reaction and Its Application to Autoclaved Aerated Concrete Formation
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- 20 May 2016, p. 210
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D-61 New Instrumentation for X-ray Material Research
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- 20 May 2016, p. 210
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