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X-ray powder diffraction study of defect-tetrahedral structure quaternary compound CuZnGa3Te6

Published online by Cambridge University Press:  06 March 2012

Rashmi
Rashmi*
Affiliation:
X-ray Analysis, National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi 110012, India
*
a)Electronic mail: rashmi@csnpl.ren.nic.in
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Abstract

Quaternary compound CuZnGa3Te6 was synthesized by the melt and anneal technique. The defect-tetrahedral structure compound crystallized in the tetragonal unit cell with possible space group I4 and Z=4/3. Complete powder diffraction data were obtained and unit cell parameters a and c, and X-ray density were calculated. These were a=0.5946(2) nm, c=1.1891(5) nm, and Dx=5.81×103 kg/m3.

Keywords

quaternary chalcogenideCuZnGa3Te6defect-tetrahedral structureX-ray diffractionpowder diffraction data
Type
New Diffraction Data
Information
Powder Diffraction , Volume 18 , Issue 3 , September 2003 , pp. 263 - 265
Copyright
Copyright © Cambridge University Press 2005

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