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X-ray powder diffraction data for rhombohedral AlPt

Published online by Cambridge University Press:  01 March 2012

Mark A. Rodriguez  and
David P. Adams
Mark A. Rodriguez
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
David P. Adams
Affiliation:
Sandia National Laboratories, Albuquerque, New Mexico 87185
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Abstract

X-ray powder diffraction data for a rhombohedral AlPt phase formed by self-propagating, high-temperature reactions of Al∕Pt bi-layer films are reported. Multilayer Al∕Pt thin film samples, reacted in air or vacuum, transformed into rhombohedral AlPt with space group R-3(148). Indexing and lattice parameter refinement of AlPt powders (generated from thin-film samples) yielded trigonal/hexagonal unit-cell lattice parameters of a=15.623(6) Å and c=5.305(2) Å, Z=39, and V=1121.5 Å3.

Keywords

X-ray diffraction (XRD)self-propagating high-temperature synthesis (SHS)AlPt
Type
New Diffraction Data
Information
Powder Diffraction , Volume 21 , Issue 4 , December 2006 , pp. 318 - 319
Copyright
Copyright © Cambridge University Press 2006

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References

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