Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-07-04T18:54:12.507Z Has data issue: false hasContentIssue false
  • English
  • Français

Use of X-Ray Powder Diffraction Rietveld Pattern-Fitting for Characterising Preferred Orientation in Gibbsites

Published online by Cambridge University Press:  10 January 2013

Li Deyu ,
Brian H. O'Connor ,
Gerald I.D. Roach  and
John B. Cornell
Li Deyu
Affiliation:
Department of Applied Physics, Curtin University of Technology, GPO U1987, Perth, Western Australia. 6001
Brian H. O'Connor
Affiliation:
Department of Applied Physics, Curtin University of Technology, GPO U1987, Perth, Western Australia. 6001
Gerald I.D. Roach
Affiliation:
Research and Development Department, Alcoa of Australia Limited, Kwinana, Western Australia. 6167
John B. Cornell
Affiliation:
Research and Development Department, Alcoa of Australia Limited, Kwinana, Western Australia. 6167
Get access Rights & Permissions [Opens in a new window]

Abstract

A study has been conducted with gibbsite specimens, on the use of Rietveld X-ray powder diffraction (XRPD) pattern fitting for quantitating preferred orientation in powders. This study has shown that an earlier formula gives results which correlate closely with an empirical measure of morphology proposed recently for gibbsite powders, viz., the ratio of the XRPD intensities for the (002) line and the (110, 200) doublet lines. A method is proposed on the basis of this correlation for the correction for preferred orientation of line intensities in gibbsite powder patterns. The correction method appears to have excellent potential for XRPD quantification of gibbsite levels in mixtures, and could have general application for coping with preferred orientation effects in the quantitation of other phases.

Type
Research Article
Information
Powder Diffraction , Volume 5 , Issue 2 , June 1990 , pp. 79 - 85
Copyright
Copyright © Cambridge University Press 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bish, D.L.& Howard, S.A.(1988). Quantitative phase analysis using the Rietveld method. J. Appl. Crystallogr. 21, 86–91.CrossRefGoogle Scholar
Chung, F.H.(1974). Quantitative interpretation of X-ray diffraction patterns of mixtures I. Matrix-flushing method of quantitative multicomponent analysis. J. Crystallogr. 7, 519–525.CrossRefGoogle Scholar
Dollase, W.A.(1986). Correction of intensities for preferred orientation in powder diffractometry: application of the March model. J Appl. Crystallogr. 19, 267–272.CrossRefGoogle Scholar
Hill, R.J.& Howard, C.J.(1986). A computer program for Rietveld analysis of fixed wavelength X-ray and neutron powder diffraction patterns: version LHPM1. Australian Atomic Energy Commission Research Establishment.Google Scholar
Hill, R.J.& Howard, C.J.(1987). Quantitative phase analysis from neutron powder diffraction data using the Rietveld method. J. Appl. Crystallogr. 20, 467–474.CrossRefGoogle Scholar
Klug, H.P.& Alexander, L.E.(1974). X-ray Diffraction Procedures. 2nded., 531–562. New York: J. Wiley & Sons.Google Scholar
March, A.(1932). Mathematische theorie der regelung nach der korngestalt bei affiner deformation. Z. Kristallogr., Kristallgeom., Kristallphys., Kristallchem. 81, 285–297.Google Scholar
Megaw, H.D.(1973). Crystal Structure: A Working Approach, 354–356. Philadelphia: W. B. Saunders Co.Google Scholar
O'Connor, B.H.& Raven, M.D.(1988). Application of the Rietveld refinement procedure in assaying powdered mixtures. Pow. Diff. 3, 2–6.CrossRefGoogle Scholar
Roach, G.I.D.& Cornell, J.B.(1988). Morphology analysis by X-ray diffraction. Proceedings of AXAA88 Conference, Perth 1988, 319–328.Google Scholar