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Quantitative phase analysis in the Ti–Al–C ternary system by X-ray diffraction

Published online by Cambridge University Press:  01 March 2012

Chang-An Wang ,
Aiguo Zhou ,
Liang Qi  and
Yong Huang
Chang-An Wang*
Affiliation:
The State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
Aiguo Zhou
Affiliation:
The State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
Liang Qi
Affiliation:
The State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
Yong Huang
Affiliation:
The State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China
*
a)Author to whom correspondence should be addressed. Electronic mail: wangca@mail.tsinghua.edu.cn
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Abstract

Materials in the Ti–Al–C ternary system commonly contain three coexisting phases, Ti3AlC2, Ti2AlC, and TiC. Quantitative phase analysis in this ternary system was investigated using X-ray diffraction. First, nonoverlap diffraction peaks were selected: the (002) peak at 2θ=9.5° for Ti3AlC2 (I∕I0=26.5), the (002) peak at 2θ=13.0° for Ti2AlC (I∕I0=39), and the (111) peak at 2θ=35.9° for TiC (I∕I0=78), respectively. Then, based on the mixing-sample method without internal standards, a set of equations was derived for determining the amounts of Ti3AlC2, Ti2AlC, and TiC in a sample using the intensities of the selected diffraction peaks. Finally, the applicability and error sources for this method were investigated. The method is simple and straightforward, and is applicable to the entire Ti–Al–C ternary system, since the derivation of this equation group is self-checking.

Keywords

quantitative phase analysisTi–Al–C ternary systemX-ray diffraction
Type
Technical Articles
Information
Powder Diffraction , Volume 20 , Issue 3 , September 2005 , pp. 218 - 223
Copyright
Copyright © Cambridge University Press 2005

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