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Measurement of thermal expansion coefficient of substrate GGG and its epitaxial layer YIG

Published online by Cambridge University Press:  10 January 2013

Rui-sheng Liang  and
Feng-chao Liu
Rui-sheng Liang
Affiliation:
Physics Department, South China Normal University, Guangzhou, 510631, People's Republic of China
Feng-chao Liu
Affiliation:
Physics Department, South China Normal University, Guangzhou, 510631, People's Republic of China
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Abstract

A new method is used in measuring the linear thermal expansion coefficients in composite consisting of a substrate Gd3Ga2Ga3O12 (GGG) and its epitaxial layer Y3Fe2Fe3O12 (YIG) within the temperature range 13.88 °C–32.50 °C. The results show that the thermal expansion coefficient of GGG in composite is larger than that of the GGG in single crystal; the thermal expansion coefficient of thick film YIG is also larger than that of thin film. The results also show that the thermal expansion coefficient of a composite consisting of film and its substrate can be measured by using a new method.

Keywords

the thermal expansion in a compositeGd3Ga2Ga3O12,Y3Fe2Fe3O12measuring the thermal expansion coefficient
Type
Research Article
Information
Powder Diffraction , Volume 14 , Issue 1 , March 1999 , pp. 2 - 4
Copyright
Copyright © Cambridge University Press 1999

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