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Geiger Counter Spectrometer for Industrial Research

Published online by Cambridge University Press:  10 January 2013

H. Friedman
H. Friedman
Affiliation:
Naval Research Laboratory, Washington, D.C.
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Extract

X-ray diffraction has many applications in the chemical and metallurgical industries, but its techniques have been confined until recently to the laboratory and to highly trained personnel. Conventional procedure entails photographic exposure, processing, and density comparisons of the finished film strips.

The Geiger counter spectrometer described below measures x-ray intensities and diffraction angles directly, without intermediate photographic steps. It is simple enough for unskilled operators performing routine industrial processes yet also meets the precise requirements of laboratory research. The instrument was developed at the Naval Research Laboratory, where it has been in regular use for the past two years.

Type
Research Article
Information
Powder Diffraction , Volume 6 , Issue 3 , September 1991 , pp. 130 - 136
Copyright
Copyright © Cambridge University Press 1991

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References

(1) Ulrey, C.T., Phys. Rev. 11, p. 401, 1918.Google Scholar
(2) Barrett, C.S., “Structure of Metals.” McGraw-Hill Book Co., New York, 1943.Google Scholar
(3) LeGalley, D.P., R.S.I. 6, p. 279, 1935.Google Scholar
(4) Bragg, W.H., and Bragg, W.L., Proc. Roy. Soc. A 88, p. 428, 1913.Google Scholar
(5) Bragg, W.H., Proc. Phys. Soc. 33, p. 222, 1921.Google Scholar
(6) Brentano, J.C.M., Proc. Phys. Soc., 37, p. 184, 1925; 47, p. 932, 1935; 49, p. 61, 1937.Google Scholar
(7) Locher, G.L., Phys. Rev. 50, p. 1099, 1936.Google Scholar
(8) Sullivan, H.M., R.S.I. 11, p. 356, 1940.Google Scholar
(9) Eisenstein, A., and Gingrich, N.S., R.S.I. 12, p. 582, 1941.Google Scholar
(10) Shaw, C.H., Phys. Rev. 57, p. 877 (1940)CrossRefGoogle Scholar
Beeman, W.W. and Friedman, H., Phys. Rev. 56, p. 392 (1939).CrossRefGoogle Scholar
(11) Lifschutz, H., R.S.I. 10, p. 21, 1939.Google Scholar
(12) Davey, W.P., General Electric Review 25, p. 565, 1922.Google Scholar