Hostname: page-component-77c89778f8-5wvtr Total loading time: 0 Render date: 2024-07-20T18:08:39.697Z Has data issue: false hasContentIssue false
  • English
  • Français

F-54 Development of Quantification Method Using Fundamental Parameter Method for EDXRF

Published online by Cambridge University Press:  20 May 2016

S. Hara ,
N. Kawahara ,
T. Matsuo  and
M. Doi
S. Hara
Affiliation:
Rigaku Corporation, Osaka, Japan
N. Kawahara
Affiliation:
Rigaku Corporation, Osaka, Japan
T. Matsuo
Affiliation:
Rigaku Corporation, Osaka, Japan
M. Doi
Affiliation:
Rigaku Corporation, Osaka, Japan
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 25 , Issue 2 , June 2010 , pp. 216
Copyright
Copyright © Cambridge University Press 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)