The analysis of crystalline organic phases by X-ray powder diffraction presents special problems, beyond those typically associated with inorganic materials. The large unit cells often associated with organic compounds, combined with the low symmetry of the structures, give rather complicated diffraction patterns that contain many low angle lines. The Bragg–Brentano geometric arrangement employed in most commercial diffractometers gives maximum (d-spacing error at low diffraction angles. This geometry, in turn, means that not only can the large (d-spacing data be of poor quality, but also that much of the low angle data required for the indexing of the pattern is subject to large errors.