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D-76 Comparison of Simulated and Experimental Xrpd Patterns of Ag with Twin Faults Using Maud and Diffax

Published online by Cambridge University Press:  20 May 2016

P. J. Schields
Affiliation:
SSCI, Inc., West Lafayette, IN
N. Dunwoody
Affiliation:
Nucryst Pharmaceuticals, Inc., Wakefield, MA

Abstract

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Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2007

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