Hostname: page-component-5c6d5d7d68-qks25 Total loading time: 0 Render date: 2024-08-25T13:07:17.116Z Has data issue: false hasContentIssue false

D-49 Recent Development of Hard X-ray Transmission Microscopy at the 32ID Beamline at the APS

Published online by Cambridge University Press:  20 May 2016

J. M. Yi
Affiliation:
APS/ Argonne National Laboratory, Argonne, IL
W. -K. Lee
Affiliation:
APS/ Argonne National Laboratory, Argonne, IL
F. De Carlo
Affiliation:
APS/ Argonne National Laboratory, Argonne, IL
Y. S. Chu
Affiliation:
APS/Argonne National Laboratory, Argonne, IL and NSLS II/Brookhaven National Laboratory, Upton, NY
W. Yun
Affiliation:
Xradia Inc., Concord, CA
Y. Hwu
Affiliation:
Academia Sinica, Taipei, Taiwan

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)