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C-7 Employing X-ray Scattering to Characterize Materials with Grain Sizes in the Nano-Regime

Published online by Cambridge University Press:  20 May 2016

E. A. Laitila  and
D. E. Mikkola
E. A. Laitila
Affiliation:
Michigan Technological University, Houghton, MI
D. E. Mikkola
Affiliation:
Michigan Technological University, Houghton, MI
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 22 , Issue 2 , June 2007 , pp. 184
Copyright
Copyright © Cambridge University Press 2007

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