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Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector

Published online by Cambridge University Press:  26 September 2017

Henry J Kirkwood Open the ORCID record for Henry J Kirkwood [Opens in a new window] ,
Martin D de Jonge ,
Daryl L Howard ,
Chris G Ryan ,
Grant van Riessen ,
Felix Hofmann ,
Matthew R Rowles ,
Anna M Paradowska  and
Brian Abbey
Henry J Kirkwood
Affiliation:
ARC Centre of Excellence in Advanced Molecular Imaging, Department of Chemistry and Physics, La Trobe Institute for Molecular Science, La Trobe University, VIC 3086, Australia
Martin D de Jonge
Affiliation:
Australian Synchrotron, 800 Blackburn Road, Clayton, VIC 3168, Australia
Daryl L Howard
Affiliation:
Australian Synchrotron, 800 Blackburn Road, Clayton, VIC 3168, Australia
Chris G Ryan
Affiliation:
CSIRO Earth Sciences and Resource Engineering, Kensington, WA 6151, Australia
Grant van Riessen
Affiliation:
Department of Chemistry and Physics, La Trobe Institute for Molecular Science, La Trobe University, VIC 3086, Australia
Felix Hofmann
Affiliation:
Department of Engineering Science, University of Oxford, Parks Road, Oxford OX1 3PJ, UK
Matthew R Rowles
Affiliation:
Department of Physics and Astronomy, Curtin University, Perth, WA 6845, Australia
Anna M Paradowska
Affiliation:
Australian Centre for Neutron Scattering, Australian Nuclear Science and Technology Organisation, NSW 2234, Australia
Brian Abbey*
Affiliation:
ARC Centre of Excellence in Advanced Molecular Imaging, Department of Chemistry and Physics, La Trobe Institute for Molecular Science, La Trobe University, VIC 3086, Australia
*
a)Author to whom correspondence should be addressed. Electronic mail: b.abbey@latrobe.edu.au
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Abstract

Elemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil.

Keywords

XANES imagingmicrofocusdiffraction mappingsynchrotron
Type
Technical Articles
Information
Powder Diffraction , Volume 32 , Supplement S2 , December 2017 , pp. S16 - S21
Copyright
Copyright © International Centre for Diffraction Data 2017 

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