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D073 Calculating Sample Displacement from Patterns with Different Fixed Incident Angles

Published online by Cambridge University Press:  20 May 2016

J.M. Neil ,
A. Navrotsky  and
H. Pilliere
J.M. Neil
Affiliation:
University of California at Davis, Davis, CA
A. Navrotsky
Affiliation:
University of California at Davis, Davis, CA
H. Pilliere
Affiliation:
Inel, Artenay, France
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 184
Copyright
Copyright © Cambridge University Press 2005

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