Hostname: page-component-76fb5796d-45l2p Total loading time: 0 Render date: 2024-04-26T17:16:44.523Z Has data issue: false hasContentIssue false
  • English
  • Français

X-ray Spectro-Microscopy and Micro-Spectroscopy in the 2100 eV to 12000 eV Region (Invited)

Published online by Cambridge University Press:  10 February 2011

N. Mölders ,
P.J. Schilling  and
J.M. Schoonmaker
N. Mölders
Affiliation:
Center for Advanced Microstructures and Devices, Louisiana State University, Baton Rouge, LA 70806, nmolder@lsu.edu
P.J. Schilling
Affiliation:
Mechanical Engineering Department, University of New Orleans, New Orleans, LA 70148, USA
J.M. Schoonmaker
Affiliation:
Center for Advanced Microstructures and Devices, Louisiana State University, Baton Rouge, LA 70806, nmolder@lsu.edu
Get access

Abstract

An x-ray microprobe beamline was recently developed and commissioned at the Center for Advanced Microstructures and Devices (CAMD), Louisiana State University. It achieves a moderate horizontal and vertical focal spot size of 18.8 µm × 7.0 µm (σ), respectively. The beamline and end-station are designed and optimized to perform (i) spatially-resolved x-ray fluorescence spectroscopy (spectro-microscopy) using the broad intense spectrum of the white synchrotron radiation, and (ii) spatially-resolved x-ray absorption spectroscopy (micro-spectroscopy) in the energy region of 2100eV to 12000 eV. These dual capabilities enable K-edge measurements and mapping, in non-vacuum conditions, of low-Z elements down to Cl, S, and P that are of both environmental interest and technological importance. In this paper, an application of this novel synchrotron tool to elucidate the elemental distribution (microstructure) and chemical state (speciation) of Mn, Cl, S, and P-containing particulates emitted from automobile engines burning methylcyclopentadienyl manganese tricarbonyl- (MMT-) added fuel will be discussed in detail. Future opportunities of this microbeam technique in materials science and materials characterization will also be outlined.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 3
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Stockbauer, R. L., Ajmera, P., Poliakoff, E. D., Craft, B. C., and Saile, V., Nuclear Instruments and Methods in Physics Research A 291, p. 505–510 (1990).10.1016/0168-9002(90)90112-JGoogle Scholar
2. Kirkpatrick, P. and Baez, A., Journal of the Optical Society of America 38, p. 766–774 (1948).10.1364/JOSA.38.000766Google Scholar
3. Kirkpatrick, P., Baez, A., and Newell, A., Physical Review 73, 535–536 (1948).Google Scholar
4. Eng, P. J., Newville, M., Rivers, M. L., and Sutton, S. R., in x-ray Microfocusing.; Applications and Technique, edited by McNulty, I. (SPIE Proceeding 3449, Bellingham, WA 1998), p. 145–156.10.1117/12.330342Google Scholar
5. Mölders, N., Moser, H. O., Saile, V., and Schilling, P. J., “Spatially-Resolved x-ray Spectroscopy at CAMD,” Report No. FZKA 6314 (1999).Google Scholar
6. Ressler, T., Wong, J., and Roos, J., accepted for publication in Environmental Science and Technology (1999).Google Scholar