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X-Ray Microbeam Diffraction Mapping of Different Texture Scales Important in Fatigue Cracking or in Large Deformations

  • S.R. Stock (a1) and Z.U. Rek (a2)

Abstract

Polychromatic synchrotron x-ray microbeam diffraction allows one to record Laue patterns simultaneously from all of the grains within the column of material irradiated. This paper describes 3-D texture mapping in polycrystalline Al and Cu samples. Transmission methods for determining the depths of diffracting volumes are outlined. The focus is on how the texture scale between micro- (i.e., individual grain orientations) and macro-texture defines fatigue crack paths in Al-Li 2090 T8E41: very large volumes of near single crystal material lead to large asperity formation, and at least forty volume percent of the material consists of these volumes. Results on grain subdivision in Cu after large deformations are also briefly reviewed.

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