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X-Ray Fluorescence Microprobe Imaging with Undulator Radiation

Published online by Cambridge University Press:  21 February 2011

Mark L. Rivers ,
Stephen R. Sutton  and
Barry M. Gordon
Mark L. Rivers
Affiliation:
Department of the Geophysical Sciences, The University of Chicago, 5734 S. Ellis Avenue, Chicago, IL 60637 Department of Applied Science, Building 815, Brookhaven National Laboratory, Upton, NY 11973
Stephen R. Sutton
Affiliation:
Department of the Geophysical Sciences, The University of Chicago, 5734 S. Ellis Avenue, Chicago, IL 60637 Department of Applied Science, Building 815, Brookhaven National Laboratory, Upton, NY 11973
Barry M. Gordon
Affiliation:
Department of Applied Science, Building 815, Brookhaven National Laboratory, Upton, NY 11973
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Abstract

Synchrotron x-ray fluorescence experiments were performed using a prototype undulator for the Advanced Photon Source installed on the CESR storage ring at Cornell University during a run in May, 1988. Fluorescence spectra were collected from a number of standard references and unknowns. Thick target minimum detectable limits (MDL) were about a factor of two higher than those obtained using white bending magnet radiation at the NSLS. The higher MDLs could be due to lower polarization and/or imperfect alignment of the Si(Li) detector. Thin target MDLs were about 10 times lower than the NSLS since the undulator produced a usable spot size which was also 10 times smaller. Several one dimensional multi-elemental scans and two dimensional images were made with 10 μm resolution and 30 ppm MDL. These experiments demonstrate that undulators on the proposed Advanced Photon Source will be ideal for a trace element x-ray fluorescence microprobe with excellent elemental sensitivity and spatial resolution.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 285
Copyright
Copyright © Materials Research Society 1989

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References

1. Rivers, M.L., in Synchrotron X-Ray Sources and New Opportunities in the Earth Sciences: Workshop Report, edited by J. Smith and M. Manghnani, (Argonne National Laboratory Report ANL/APS-TM-3) pp. 5–22; S.R. Sutton et. al., in Synchrotron X-Ray Sources and New Opportunities in the Earth Sciences: Workshop Report, edited by J. Smith and M. Manghnani, (Argonne National Laboratory Report ANL/APS-TM-3), pp. 93–112.Google Scholar
2. Hanson, A.L., Jones, K.W., Gordon, B.M., Pounds, J.G., Kwiatek, W., Rivers, M.L., Schidlovsky, G. and Sutton, S.R., Nucl. Instrum. Methods B24–25, 400, 1987.Google Scholar
3. Rivers, M.L., in X-Ray Microscopy II, edited by Sayre, D., Howells, M., Kirz, J., and Rarback, H. (Springer-Verlag, New York, 1988) pp. 233–239; S.R. Sutton, in X-Ray Microscopy II, edited by D. Sayre, M. Howells, J. Kirz, and H. Rarback (Springer-Verlag, New York, 1988) pp. 438–431.Google Scholar