Skip to main content Accessibility help
×
Home

X-Ray Diffraction Analysis and Modeling of Strain Induced Thermal Cycling in a Thin Aluminum (011) Bicrystal Film

  • D. E. Nowak (a1), O. Thomas (a2), S. P. Baker (a1), E. A. Stach (a3), K. Balzuweit (a3) and U. Dahmen (a3)...

Abstract

Heteroepitaxial films of aluminum bicrystals grown on silicon provide a model system in which to study plasticity in polycrystalline metal thin films. For the bicrystal films, dislocations are confined to move on two different slip plane orientations because of the orientation of the crystals on the substrate. In-situ transmission electron microscopy (TEM) observations during thermal cycling have shown two threshold temperatures for dislocation motion on cooling. A simple model uses the resolved shear stress on the possible slip planes to explain the TEM observations. Mechanisms responsible for the dislocation behavior are studied in-situ during thermal cycling between room temperature and 450°C with x-ray diffraction. The strains are determined using a sin2(Ψ) analysis at each temperature. Direct comparisons are made between the TEM observations, the model and x-ray diffraction results.

Copyright

References

Hide All
1. Stach, E.A., Dahmen, U., Minor, A.M., Morris, J.W. Jr, Nix, W.D., in Recent developments in Oxide and Metal Epitaxy--Theory and Experiment, Edited by Yeadon, M. and Auciello, O. (Mat. Res. Soc. Proc. 619, Warrendale PA 2000)
2. Thangaraj, N., Westmacott, K.H., and Dahmen, U., Appl. Phys. Let, 61, p. 37 (1992)
3. Freund, L.B., J. Appl. Mech., 54, p. 553 (1987)
4. Nix, W.D., Met. Trans. A, 20A, p. 2217 (1989)
5. Clemens, B.M. and Bain, J.A., MRS Bulletin, 17, p. 46 (1992)
6. Touloukian, Y.S. and Ho, C.Y., eds., Thermal Expansion Non-Metallic Elements and Alloys, vol. 13, (New York, IFI/Plenum 1975)
7. Touloukian, Y.S. and Ho, C.Y., eds., Thermal Expansion Metallic Elements and Alloys, vol. 12, (New York, IFI/Plenum 1977)
8. Baker, S.P., Keller, R.-M., and Arzt, E., in Thin-Films - Stresses and Mechanical Properties VII, Edited by Cammarata, R.C., Busso, E.P., Nastasi, M., Oliver, W.C., (Mat. Res. Soc. Proc. 505, Warrendale PA 1997)
9. Baker, S.P., Kretschmann, A., and Arzt, E., Acta Mat., 49 p. 2145 (2001)

X-Ray Diffraction Analysis and Modeling of Strain Induced Thermal Cycling in a Thin Aluminum (011) Bicrystal Film

  • D. E. Nowak (a1), O. Thomas (a2), S. P. Baker (a1), E. A. Stach (a3), K. Balzuweit (a3) and U. Dahmen (a3)...

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed